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ADVANCES IN CHARACTERIZING AND CONTROLLING METAL-SEMICONDUCTOR INTERFACES

被引：3
作者：
BRILLSON, LJ
机构：
来源：
APPLICATIONS OF SURFACE SCIENCE | 1985年 / 22-3卷 / MAY期
关键词：
D O I：
10.1016/0378-5963(85)90228-4
中图分类号：
学科分类号：
摘要：
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页码：948 / 968
页数：21
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