HIGH-RESOLUTION ELECTRON-ENERGY LOSS SPECTROSCOPY AS A PROBE OF SURFACE-MORPHOLOGY AND ELECTRONIC STATES AT METAL-SEMICONDUCTOR INTERFACES

被引：8

作者：

CHAMBERS, SA ^{[1
]}

DELGIUDICE, M ^{[1
]}

RUCKMAN, MW ^{[1
]}

ANDERSON, SB ^{[1
]}

WEAVER, JH ^{[1
]}

LAPEYRE, GJ ^{[1
]}

机构：

[1] MONTANA STATE UNIV,DEPT PHYS,BOZEMAN,MT 59717

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1986年 / 4卷 / 03期

关键词：

D O I：

10.1116/1.573514

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：1595 / 1598

页数：4

共 20 条

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