SURFACE-STATE DENSITY DISTRIBUTION AT AN AL2O3-INP METAL-INSULATOR-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR MEASURED BY THE CHARGE PUMPING TECHNIQUE

被引:3
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KOBAYASHI, T
ICHIKAWA, T
SAWAI, T
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10.1063/1.97612
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O59 [应用物理学];
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页码:351 / 353
页数:3
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