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INFLUENCE OF MELT COMPOSITION ON ELECTRON-MOBILITY IN SI-DOPED LEC GAAS
被引:11
作者
:
FORNARI, R
论文数:
0
引用数:
0
h-index:
0
FORNARI, R
机构
:
来源
:
JOURNAL OF CRYSTAL GROWTH
|
1989年
/ 94卷
/ 02期
关键词
:
D O I
:
10.1016/0022-0248(89)90018-3
中图分类号
:
O7 [晶体学];
学科分类号
:
0702 ;
070205 ;
0703 ;
080501 ;
摘要
:
引用
收藏
页码:433 / 440
页数:8
相关论文
共 21 条
[1]
THE PROPERTIES OF GALLIUM-ARSENIDE DOUBLY DOPED WITH SILICON AND GERMANIUM OR SILICON AND TIN
[J].
BROZEL, MR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV READING,JJ THOMSON PHYS LAB,READING RG6 2AF,BERKSHIRE,ENGLAND
UNIV READING,JJ THOMSON PHYS LAB,READING RG6 2AF,BERKSHIRE,ENGLAND
BROZEL, MR
;
LAITHWAITE, K
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV READING,JJ THOMSON PHYS LAB,READING RG6 2AF,BERKSHIRE,ENGLAND
UNIV READING,JJ THOMSON PHYS LAB,READING RG6 2AF,BERKSHIRE,ENGLAND
LAITHWAITE, K
;
NEWMAN, RC
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV READING,JJ THOMSON PHYS LAB,READING RG6 2AF,BERKSHIRE,ENGLAND
UNIV READING,JJ THOMSON PHYS LAB,READING RG6 2AF,BERKSHIRE,ENGLAND
NEWMAN, RC
;
OZBAY, B
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV READING,JJ THOMSON PHYS LAB,READING RG6 2AF,BERKSHIRE,ENGLAND
UNIV READING,JJ THOMSON PHYS LAB,READING RG6 2AF,BERKSHIRE,ENGLAND
OZBAY, B
.
JOURNAL OF CRYSTAL GROWTH,
1980,
50
(03)
:619
-624
[2]
CARBON, OXYGEN AND SILICON IMPURITIES IN GALLIUM-ARSENIDE
[J].
BROZEL, MR
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
BROZEL, MR
;
CLEGG, JB
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
CLEGG, JB
;
NEWMAN, RC
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
NEWMAN, RC
.
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
1978,
11
(09)
:1331
-1339
[3]
TIN SEGREGATION AND DONOR COMPENSATION IN MELT-GROWN GALLIUM-ARSENIDE
[J].
BROZEL, MR
论文数:
0
引用数:
0
h-index:
0
机构:
TRENT POLYTECH,DEPT ELECT & ELECTR ENGN,NOTTINGHAM NG1 4BU,ENGLAND
BROZEL, MR
;
FOULKES, EJ
论文数:
0
引用数:
0
h-index:
0
机构:
TRENT POLYTECH,DEPT ELECT & ELECTR ENGN,NOTTINGHAM NG1 4BU,ENGLAND
FOULKES, EJ
;
GRANT, IR
论文数:
0
引用数:
0
h-index:
0
机构:
TRENT POLYTECH,DEPT ELECT & ELECTR ENGN,NOTTINGHAM NG1 4BU,ENGLAND
GRANT, IR
;
HURLE, DTJ
论文数:
0
引用数:
0
h-index:
0
机构:
TRENT POLYTECH,DEPT ELECT & ELECTR ENGN,NOTTINGHAM NG1 4BU,ENGLAND
HURLE, DTJ
.
JOURNAL OF CRYSTAL GROWTH,
1987,
80
(02)
:323
-332
[4]
PRECIPITATE IDENTIFICATION IN LEC-GROWN SI-DOPED GAAS
[J].
COCKAYNE, B
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV BIRMINGHAM,DEPT MET & MAT,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND
UNIV BIRMINGHAM,DEPT MET & MAT,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND
COCKAYNE, B
;
MACEWAN, WR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV BIRMINGHAM,DEPT MET & MAT,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND
UNIV BIRMINGHAM,DEPT MET & MAT,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND
MACEWAN, WR
;
HOPE, DAO
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV BIRMINGHAM,DEPT MET & MAT,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND
UNIV BIRMINGHAM,DEPT MET & MAT,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND
HOPE, DAO
;
HARRIS, IR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV BIRMINGHAM,DEPT MET & MAT,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND
UNIV BIRMINGHAM,DEPT MET & MAT,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND
HARRIS, IR
;
SMITH, NA
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV BIRMINGHAM,DEPT MET & MAT,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND
UNIV BIRMINGHAM,DEPT MET & MAT,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND
SMITH, NA
.
JOURNAL OF CRYSTAL GROWTH,
1988,
87
(01)
:6
-12
[5]
DISLOCATION-FREE SILICON-DOPED GALLIUM-ARSENIDE GROWN BY LEC PROCEDURE
[J].
FORNARI, R
论文数:
0
引用数:
0
h-index:
0
FORNARI, R
;
PAORICI, C
论文数:
0
引用数:
0
h-index:
0
PAORICI, C
;
ZANOTTI, L
论文数:
0
引用数:
0
h-index:
0
ZANOTTI, L
;
ZUCCALLI, G
论文数:
0
引用数:
0
h-index:
0
ZUCCALLI, G
.
JOURNAL OF CRYSTAL GROWTH,
1983,
63
(02)
:415
-418
[6]
SI-DOPING EFFECT ON ELECTRICAL-PROPERTIES OF LEC-GAAS CRYSTALS
[J].
FORNARI, R
论文数:
0
引用数:
0
h-index:
0
FORNARI, R
;
ZANOTTI, L
论文数:
0
引用数:
0
h-index:
0
ZANOTTI, L
;
ZUCCALLI, G
论文数:
0
引用数:
0
h-index:
0
ZUCCALLI, G
.
MATERIALS CHEMISTRY AND PHYSICS,
1983,
9
(1-3)
:307
-314
[7]
A STUDY OF MICRODEFECTS IN N-TYPE DOPED GAAS CRYSTALS USING CATHODOLUMINESCENCE AND X-RAY TECHNIQUES
[J].
FORNARI, R
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV PARMA,DEPARTIMENTO FIS,I-43100 PARMA,ITALY
UNIV PARMA,DEPARTIMENTO FIS,I-43100 PARMA,ITALY
FORNARI, R
;
FRANZOSI, P
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV PARMA,DEPARTIMENTO FIS,I-43100 PARMA,ITALY
UNIV PARMA,DEPARTIMENTO FIS,I-43100 PARMA,ITALY
FRANZOSI, P
;
SALVIATI, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV PARMA,DEPARTIMENTO FIS,I-43100 PARMA,ITALY
UNIV PARMA,DEPARTIMENTO FIS,I-43100 PARMA,ITALY
SALVIATI, G
;
论文数:
引用数:
h-index:
机构:
FERRARI, C
;
GHEZZI, C
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV PARMA,DEPARTIMENTO FIS,I-43100 PARMA,ITALY
UNIV PARMA,DEPARTIMENTO FIS,I-43100 PARMA,ITALY
GHEZZI, C
.
JOURNAL OF CRYSTAL GROWTH,
1985,
72
(03)
:717
-725
[8]
INFLUENCE OF SI AND S DOPING ON STRUCTURAL DEFECTS IN LEC-GROWN GALLIUM-ARSENIDE
[J].
GILING, LJ
论文数:
0
引用数:
0
h-index:
0
机构:
MASPEC INST, CNR, I-43100 PARMA, ITALY
MASPEC INST, CNR, I-43100 PARMA, ITALY
GILING, LJ
;
WEYHER, JL
论文数:
0
引用数:
0
h-index:
0
机构:
MASPEC INST, CNR, I-43100 PARMA, ITALY
MASPEC INST, CNR, I-43100 PARMA, ITALY
WEYHER, JL
;
MONTREE, A
论文数:
0
引用数:
0
h-index:
0
机构:
MASPEC INST, CNR, I-43100 PARMA, ITALY
MASPEC INST, CNR, I-43100 PARMA, ITALY
MONTREE, A
;
FORNARI, R
论文数:
0
引用数:
0
h-index:
0
机构:
MASPEC INST, CNR, I-43100 PARMA, ITALY
MASPEC INST, CNR, I-43100 PARMA, ITALY
FORNARI, R
;
ZANOTTI, L
论文数:
0
引用数:
0
h-index:
0
机构:
MASPEC INST, CNR, I-43100 PARMA, ITALY
MASPEC INST, CNR, I-43100 PARMA, ITALY
ZANOTTI, L
.
JOURNAL OF CRYSTAL GROWTH,
1986,
79
(1-3)
:271
-279
[9]
THE SITE DISTRIBUTION OF AMPHOTERIC DOPANTS IN MULTIPLY-DOPED GAAS
[J].
HURLE, DTJ
论文数:
0
引用数:
0
h-index:
0
HURLE, DTJ
.
JOURNAL OF CRYSTAL GROWTH,
1980,
50
(03)
:638
-643
[10]
KAMATH GS, 1984, SOLID STATE TECHNOL, P174
←
1
2
3
→
共 21 条
[1]
THE PROPERTIES OF GALLIUM-ARSENIDE DOUBLY DOPED WITH SILICON AND GERMANIUM OR SILICON AND TIN
[J].
BROZEL, MR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV READING,JJ THOMSON PHYS LAB,READING RG6 2AF,BERKSHIRE,ENGLAND
UNIV READING,JJ THOMSON PHYS LAB,READING RG6 2AF,BERKSHIRE,ENGLAND
BROZEL, MR
;
LAITHWAITE, K
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV READING,JJ THOMSON PHYS LAB,READING RG6 2AF,BERKSHIRE,ENGLAND
UNIV READING,JJ THOMSON PHYS LAB,READING RG6 2AF,BERKSHIRE,ENGLAND
LAITHWAITE, K
;
NEWMAN, RC
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV READING,JJ THOMSON PHYS LAB,READING RG6 2AF,BERKSHIRE,ENGLAND
UNIV READING,JJ THOMSON PHYS LAB,READING RG6 2AF,BERKSHIRE,ENGLAND
NEWMAN, RC
;
OZBAY, B
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV READING,JJ THOMSON PHYS LAB,READING RG6 2AF,BERKSHIRE,ENGLAND
UNIV READING,JJ THOMSON PHYS LAB,READING RG6 2AF,BERKSHIRE,ENGLAND
OZBAY, B
.
JOURNAL OF CRYSTAL GROWTH,
1980,
50
(03)
:619
-624
[2]
CARBON, OXYGEN AND SILICON IMPURITIES IN GALLIUM-ARSENIDE
[J].
BROZEL, MR
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
BROZEL, MR
;
CLEGG, JB
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
CLEGG, JB
;
NEWMAN, RC
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
PHILIPS RES LABS, REDHILL RH1 5HA, SURREY, ENGLAND
NEWMAN, RC
.
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
1978,
11
(09)
:1331
-1339
[3]
TIN SEGREGATION AND DONOR COMPENSATION IN MELT-GROWN GALLIUM-ARSENIDE
[J].
BROZEL, MR
论文数:
0
引用数:
0
h-index:
0
机构:
TRENT POLYTECH,DEPT ELECT & ELECTR ENGN,NOTTINGHAM NG1 4BU,ENGLAND
BROZEL, MR
;
FOULKES, EJ
论文数:
0
引用数:
0
h-index:
0
机构:
TRENT POLYTECH,DEPT ELECT & ELECTR ENGN,NOTTINGHAM NG1 4BU,ENGLAND
FOULKES, EJ
;
GRANT, IR
论文数:
0
引用数:
0
h-index:
0
机构:
TRENT POLYTECH,DEPT ELECT & ELECTR ENGN,NOTTINGHAM NG1 4BU,ENGLAND
GRANT, IR
;
HURLE, DTJ
论文数:
0
引用数:
0
h-index:
0
机构:
TRENT POLYTECH,DEPT ELECT & ELECTR ENGN,NOTTINGHAM NG1 4BU,ENGLAND
HURLE, DTJ
.
JOURNAL OF CRYSTAL GROWTH,
1987,
80
(02)
:323
-332
[4]
PRECIPITATE IDENTIFICATION IN LEC-GROWN SI-DOPED GAAS
[J].
COCKAYNE, B
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV BIRMINGHAM,DEPT MET & MAT,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND
UNIV BIRMINGHAM,DEPT MET & MAT,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND
COCKAYNE, B
;
MACEWAN, WR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV BIRMINGHAM,DEPT MET & MAT,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND
UNIV BIRMINGHAM,DEPT MET & MAT,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND
MACEWAN, WR
;
HOPE, DAO
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV BIRMINGHAM,DEPT MET & MAT,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND
UNIV BIRMINGHAM,DEPT MET & MAT,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND
HOPE, DAO
;
HARRIS, IR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV BIRMINGHAM,DEPT MET & MAT,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND
UNIV BIRMINGHAM,DEPT MET & MAT,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND
HARRIS, IR
;
SMITH, NA
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV BIRMINGHAM,DEPT MET & MAT,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND
UNIV BIRMINGHAM,DEPT MET & MAT,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND
SMITH, NA
.
JOURNAL OF CRYSTAL GROWTH,
1988,
87
(01)
:6
-12
[5]
DISLOCATION-FREE SILICON-DOPED GALLIUM-ARSENIDE GROWN BY LEC PROCEDURE
[J].
FORNARI, R
论文数:
0
引用数:
0
h-index:
0
FORNARI, R
;
PAORICI, C
论文数:
0
引用数:
0
h-index:
0
PAORICI, C
;
ZANOTTI, L
论文数:
0
引用数:
0
h-index:
0
ZANOTTI, L
;
ZUCCALLI, G
论文数:
0
引用数:
0
h-index:
0
ZUCCALLI, G
.
JOURNAL OF CRYSTAL GROWTH,
1983,
63
(02)
:415
-418
[6]
SI-DOPING EFFECT ON ELECTRICAL-PROPERTIES OF LEC-GAAS CRYSTALS
[J].
FORNARI, R
论文数:
0
引用数:
0
h-index:
0
FORNARI, R
;
ZANOTTI, L
论文数:
0
引用数:
0
h-index:
0
ZANOTTI, L
;
ZUCCALLI, G
论文数:
0
引用数:
0
h-index:
0
ZUCCALLI, G
.
MATERIALS CHEMISTRY AND PHYSICS,
1983,
9
(1-3)
:307
-314
[7]
A STUDY OF MICRODEFECTS IN N-TYPE DOPED GAAS CRYSTALS USING CATHODOLUMINESCENCE AND X-RAY TECHNIQUES
[J].
FORNARI, R
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV PARMA,DEPARTIMENTO FIS,I-43100 PARMA,ITALY
UNIV PARMA,DEPARTIMENTO FIS,I-43100 PARMA,ITALY
FORNARI, R
;
FRANZOSI, P
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV PARMA,DEPARTIMENTO FIS,I-43100 PARMA,ITALY
UNIV PARMA,DEPARTIMENTO FIS,I-43100 PARMA,ITALY
FRANZOSI, P
;
SALVIATI, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV PARMA,DEPARTIMENTO FIS,I-43100 PARMA,ITALY
UNIV PARMA,DEPARTIMENTO FIS,I-43100 PARMA,ITALY
SALVIATI, G
;
论文数:
引用数:
h-index:
机构:
FERRARI, C
;
GHEZZI, C
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV PARMA,DEPARTIMENTO FIS,I-43100 PARMA,ITALY
UNIV PARMA,DEPARTIMENTO FIS,I-43100 PARMA,ITALY
GHEZZI, C
.
JOURNAL OF CRYSTAL GROWTH,
1985,
72
(03)
:717
-725
[8]
INFLUENCE OF SI AND S DOPING ON STRUCTURAL DEFECTS IN LEC-GROWN GALLIUM-ARSENIDE
[J].
GILING, LJ
论文数:
0
引用数:
0
h-index:
0
机构:
MASPEC INST, CNR, I-43100 PARMA, ITALY
MASPEC INST, CNR, I-43100 PARMA, ITALY
GILING, LJ
;
WEYHER, JL
论文数:
0
引用数:
0
h-index:
0
机构:
MASPEC INST, CNR, I-43100 PARMA, ITALY
MASPEC INST, CNR, I-43100 PARMA, ITALY
WEYHER, JL
;
MONTREE, A
论文数:
0
引用数:
0
h-index:
0
机构:
MASPEC INST, CNR, I-43100 PARMA, ITALY
MASPEC INST, CNR, I-43100 PARMA, ITALY
MONTREE, A
;
FORNARI, R
论文数:
0
引用数:
0
h-index:
0
机构:
MASPEC INST, CNR, I-43100 PARMA, ITALY
MASPEC INST, CNR, I-43100 PARMA, ITALY
FORNARI, R
;
ZANOTTI, L
论文数:
0
引用数:
0
h-index:
0
机构:
MASPEC INST, CNR, I-43100 PARMA, ITALY
MASPEC INST, CNR, I-43100 PARMA, ITALY
ZANOTTI, L
.
JOURNAL OF CRYSTAL GROWTH,
1986,
79
(1-3)
:271
-279
[9]
THE SITE DISTRIBUTION OF AMPHOTERIC DOPANTS IN MULTIPLY-DOPED GAAS
[J].
HURLE, DTJ
论文数:
0
引用数:
0
h-index:
0
HURLE, DTJ
.
JOURNAL OF CRYSTAL GROWTH,
1980,
50
(03)
:638
-643
[10]
KAMATH GS, 1984, SOLID STATE TECHNOL, P174
←
1
2
3
→