A 1ST-ORDER THEORY OF THE STATIC INDUCTION TRANSISTOR

被引:33
作者
BULUCEA, C [1 ]
RUSU, A [1 ]
机构
[1] POLYTECH INST BUCHAREST,BUCHAREST,ROMANIA
关键词
D O I
10.1016/0038-1101(87)90046-3
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A first-order theory of the static induction transistor (SIT) is proposed, which provides a unitary analytical description of its characteristics over the full range of normally encountered biasing conditions. The blocking-state and low-current analysis is based on the original modeling device of considering the intrinsic region of the SIT biased, across its boundary to the drain, by a cosine potential, the maximum value of which is set by a virtual intrinsic-drain electrode. The analytical development leads to design equations for specific SIT parameters such as barrier height, gate efficiency, voltage gain factor and forward blocking gain. The predicted low-current I-V characteristics are consistent with reported experimental data. Numerical over-relaxation calculations have been used for a spot-check verification of the analytical model, as well as for extracting the pertinent parameters of the extrinsic region.
引用
收藏
页码:1227 / 1242
页数:16
相关论文
共 39 条
[1]   A SIMPLE METHOD FOR PREDICTING THE FORWARD BLOCKING GAIN OF GRIDDED FIELD-EFFECT DEVICES WITH RECTANGULAR GRIDS [J].
ADLER, MS ;
BALIGA, BJ .
SOLID-STATE ELECTRONICS, 1980, 23 (07) :735-740
[5]  
BALIGA BJ, 1978, IEEE IEDM TECH DIG, P661
[6]   STATIC INDUCTION TRANSISTORS OPTIMIZED FOR HIGH-VOLTAGE OPERATION AND HIGH MICROWAVE-POWER OUTPUT [J].
BENCUYA, I ;
COGAN, AI ;
BUTLER, SJ ;
REGAN, RJ .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (07) :1321-1327
[7]   FABRICATION AND NUMERICAL-SIMULATION OF THE PERMEABLE BASE TRANSISTOR [J].
BOZLER, CO ;
ALLEY, GD .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1980, 27 (06) :1128-1141
[8]   BARRIER MODE BEHAVIOR OF A JUNCTION FET AT LOW DRAIN CURRENTS [J].
BREWER, RJ .
SOLID-STATE ELECTRONICS, 1975, 18 (11) :1013-1017
[9]   SURFACE BREAKDOWN IN SILICON PLANAR JUNCTIONS - COMPUTER-AIDED EXPERIMENTAL DETERMINATION OF CRITICAL-FIELD [J].
BULUCEA, C ;
RUSU, A ;
POSTOLACHE, C .
SOLID-STATE ELECTRONICS, 1974, 17 (09) :881-888
[10]  
Cogan A., 1983, International Electron Devices Meeting 1983. Technical Digest, P221