INTERSTITIAL PRECURSOR TO SILICIDE FORMATION ON SI(111)-(7X7)

被引:69
作者
BENNETT, PA
CAHILL, DG
COPEL, M
机构
[1] UNIV ILLINOIS,DEPT MAT SCI & ENGN,URBANA,IL 61801
[2] IBM CORP,THOMAS J WATSON RES CTR,DIV RES,YORKTOWN HTS,NY 10598
关键词
D O I
10.1103/PhysRevLett.73.452
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We show that cobalt atoms deposited on Si(111)-(7 x 7) at room temperature occupy near-surface interstitial sites of the silicon lattice at very low coverages. These sites are visible in scanning tunneling microscopy images as slightly lowered groups of 2 or 3 adjacent Si adatoms in an otherwise intact Si(111)-(7 x 7) surface. At 150-degrees-C the interstitials are mobile and preferentially occupy sites directly under 3-coordinated silicon surface atoms (''rest atoms'') on the faulted side of the 7 x 7 unit cell. An atom-displacing silicide reaction occurs only for higher coverages, when 7 x 7 half-unit cells become multipy occupied.
引用
收藏
页码:452 / 455
页数:4
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