STRUCTURAL CHARACTERIZATION OF TIN DOPED INDIUM OXIDE-FILMS PREPARED BY MAGNETRON SPUTTERING

被引：10

作者：

BANERJEE, R ^{[1
]}

RAY, S ^{[1
]}

BATABYAL, AK ^{[1
]}

BARUA, AK ^{[1
]}

SEN, S ^{[1
]}

机构：

[1] CENT GLASS & CERAM RES INST, CALCUTTA 700032, W BENGAL, INDIA

来源：

JOURNAL OF MATERIALS SCIENCE | 1985年 / 20卷 / 08期

关键词：

D O I：

10.1007/BF00553058

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：2937 / 2944

页数：8

共 15 条

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[9] STRUCTURAL CHARACTERIZATION OF TRANSPARENT SEMICONDUCTING THIN-FILMS OF SNO2 AND IN2O3 [J].

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[10] PREPARATION OF IN2O3 AND TIN-DOPED IN2O3 FILMS BY A NOVEL ACTIVATED REACTIVE EVAPORATION TECHNIQUE [J].

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