Kinetics of formation of silicides: A review

被引:369
作者
d'Heurle, F. M. [1 ]
Gas, P. [1 ,2 ]
机构
[1] IBM Corp, Res Ctr, Yorktown Hts, NY 10598 USA
[2] Fac Sci St Jerome, Met Lab, UA 443, F-13397 Marseille, France
关键词
D O I
10.1557/JMR.1986.0205
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The kinetics of silicide growth are classified into three different categories: (a) diffusion controlled, (b) nucleation controlled, (c) others (reaction rate controlled). These are analyzed with the aim of understanding both the phenomenology of growth and the specific atomic mechanisms of phase formation. Diffusion-controlled growth is discussed with respect to the Nernst-Einstein equation. Stress relaxation is considered as a possible cause of reaction-rate control. The relative merits of two different types of marker experiments are compared. A few silicides are discussed in terms of what can be inferred about diffusion mechanisms. The competition between reaction-rate and diffusion control phenomena is shown to have specific effects on the sequence of phase formation; it is also related to the formation of some amorphous compounds. Reactions between silicon and alloyed metal films are used to illustrate the respective influences of mobility and driving force factors on the kinetics of silicide growth; they can also be used to underline the dominance of nucleation over diffusion in some silicide formation processes.
引用
收藏
页码:205 / 221
页数:17
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