PLASMA OXIDATION OF SILICON

被引:14
作者
RAY, AK
机构
关键词
D O I
10.1016/0040-6090(81)90174-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:389 / 396
页数:8
相关论文
共 22 条
[1]   METHOD OF FORMATION OF THIN OXIDE-FILMS ON SILICON IN A MICROWAVE MAGNETOACTIVE OXYGEN PLASMA [J].
BARDOS, L ;
LONCAR, G ;
STOLL, I ;
MUSIL, J ;
ZACEK, F .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1975, 8 (16) :L195-L197
[2]   TOPOLOGY OF SILICON STRUCTURES WITH RECESSED SIO2 [J].
BASSOUS, E ;
YU, HN ;
MANISCALCO, V .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1976, 123 (11) :1729-1737
[3]   OXYGEN-PRESSURE AS A PARAMETER IN THE DC PLASMA ANODIZATION OF SILICON [J].
BECK, RB ;
PATYRA, M ;
RUZYLLO, J ;
JAKUBOWSKI, A .
THIN SOLID FILMS, 1980, 67 (02) :261-264
[4]   COMPARATIVE STUDY OF PLASMA ANODIZATION OF SILICON IN A COLUMN OF A DC GLOW DISCHARGE [J].
COPELAND, MA ;
PAPPU, R .
APPLIED PHYSICS LETTERS, 1971, 19 (06) :199-&
[5]   OBSERVATION OF IMPURITY REDUSTRIBUTION DURING THERMAL OXIDATION OF SILICON USING MOS STRUCTURE [J].
DEAL, BE ;
GROVE, AS ;
SNOW, EH ;
SAH, CT .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1965, 112 (03) :308-&
[6]   GROWTH OF SIO2-FILMS ON SI IN AN OXYGEN MICROWAVE-DISCHARGE [J].
DRAGILA, R ;
BARDOS, L ;
LONCAR, G .
THIN SOLID FILMS, 1976, 34 (01) :115-117
[7]   FORMATION OF STACKING-FAULTS AND ENHANCED DIFFUSION IN OXIDATION OF SILICON [J].
HU, SM .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (04) :1567-1573
[8]   SILICON OXIDE FILMS GROWN IN A MICROWAVE DISCHARGE [J].
KRAITCHMAN, J .
JOURNAL OF APPLIED PHYSICS, 1967, 38 (11) :4323-+
[9]   SILICON OXIDATION IN AN OXYGEN PLASMA EXCITED BY MICROWAVES [J].
LIGENZA, JR .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (09) :2703-+
[10]  
LIGENZA JR, 1970, SOLID STATE TECHNOL, P33