SILICON ON INSULATOR MATERIAL BY WAFER BONDING

被引:22
作者
HARENDT, C [1 ]
HUNT, CE [1 ]
APPEL, W [1 ]
GRAF, HG [1 ]
HOFFLINGER, B [1 ]
PENTEKER, E [1 ]
机构
[1] UNIV CALIF DAVIS,DEPT ELECT ENGN & COMP SCI,DAVIS,CA 95616
关键词
SILICON ON INSULATOR; WAFER BONDING; SELECTIVE ETCHING;
D O I
10.1007/BF02651903
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Thermal bonding of oxidized silicon wafers is used to obtain high-quality silicon on insulator (SOI) starting material for electronics and sensor applications. An overview of the technology is followed by a detailed description of the bonding technique and the ensuing wafer thinning processes for making SOI of various film thicknesses. Bonded pairs of wafers can be reproducibly produced free of contact voids. Thick-film SOI is produced using a simple bond and grind/polish technique. Thin-film SOI, suitable for CMOS applications, is produced using the bond and etch back (BE-SOI) process. A comparison of selective etch-back chemistry with different etchstop fabrication techniques is presented. These methods produce inexpensive, low-defect SOI, for integrated circuit applications, using materials and equipment common to silicon integrated circuit process lines.
引用
收藏
页码:267 / 277
页数:11
相关论文
共 17 条
[1]  
Bassous E., 1989, Microelectronic Engineering, V9, P167, DOI 10.1016/0167-9317(89)90039-7
[2]   SILICON AND SILICON DIOXIDE THERMAL BONDING FOR SILICON-ON-INSULATOR APPLICATIONS [J].
BLACK, RD ;
ARTHUR, SD ;
GILMORE, RS ;
LEWIS, N ;
HALL, EL ;
LILLQUIST, RD .
JOURNAL OF APPLIED PHYSICS, 1988, 63 (08) :2773-2777
[3]   DIELECTRIC ISOLATED INTEGRATED CIRCUIT SUBSTRATE PROCESSES [J].
DAVIDSOH.US ;
LEE, F .
PROCEEDINGS OF THE IEEE, 1969, 57 (09) :1532-&
[4]   A FIELD-ASSISTED BONDING PROCESS FOR SILICON DIELECTRIC ISOLATION [J].
FRYE, RC ;
GRIFFITH, JE ;
WONG, YH .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1986, 133 (08) :1673-1677
[5]   SILICON-ON-INSULATOR WAFER BONDING-WAFER THINNING TECHNOLOGICAL EVALUATIONS [J].
HAISMA, J ;
SPIERINGS, GACM ;
BIERMANN, UKP ;
PALS, JA .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1989, 28 (08) :1426-1443
[6]   DEVICE LAYER TRANSFER TECHNIQUE USING CHEMI-MECHANICAL POLISHING [J].
HAMAGUCHI, T ;
ENDO, N ;
KIMURA, M ;
ISHITANI, A .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1984, 23 (10) :L815-L817
[7]  
HARENDT C, 1989, SENSORS ACTUATORS A, V23, P927
[8]   EPITAXIAL FILM TRANSFER TECHNIQUE FOR PRODUCING SINGLE-CRYSTAL SI FILM ON AN INSULATING SUBSTRATE [J].
KIMURA, M ;
EGAMI, K ;
KANAMORI, M ;
HAMAGUCHI, T .
APPLIED PHYSICS LETTERS, 1983, 43 (03) :263-265
[9]  
Lasky J. B., 1985, International Electron Devices Meeting. Technical Digest (Cat. No. 85CH2252-5), P684
[10]   WAFER BONDING FOR SILICON-ON-INSULATOR TECHNOLOGIES [J].
LASKY, JB .
APPLIED PHYSICS LETTERS, 1986, 48 (01) :78-80