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AUTODOPING OF EPITAXIAL SILICON LAYERS (III) - THEORETICAL TREATMENT OF LATERAL AUTODOPING
被引:4
作者
:
KUHNE, H
论文数:
0
引用数:
0
h-index:
0
KUHNE, H
机构
:
来源
:
CRYSTAL RESEARCH AND TECHNOLOGY
|
1986年
/ 21卷
/ 12期
关键词
:
D O I
:
10.1002/crat.2170211202
中图分类号
:
O7 [晶体学];
学科分类号
:
0702 ;
070205 ;
0703 ;
080501 ;
摘要
:
引用
收藏
页码:1495 / 1502
页数:8
相关论文
共 10 条
[1]
AUTODOPING OF ANTIMONY AND ARSENIC IN SILICON EPITAXIAL LAYERS
[J].
KATONA, P
论文数:
0
引用数:
0
h-index:
0
KATONA, P
.
THIN SOLID FILMS,
1983,
100
(01)
:9
-15
[2]
DECOMPOSITION EQUILIBRIUM OF ARSINE AND LOW-PRESSURE DOPING OF EPITAXIAL CVD SILICON
[J].
KOKOVIN, GA
论文数:
0
引用数:
0
h-index:
0
机构:
AKAD WISSENSCH DDR,INST HALBLEITERPHYS,DDR-1200 FRANKFURT,GER DEM REP
AKAD WISSENSCH DDR,INST HALBLEITERPHYS,DDR-1200 FRANKFURT,GER DEM REP
KOKOVIN, GA
;
TESTOVA, NA
论文数:
0
引用数:
0
h-index:
0
机构:
AKAD WISSENSCH DDR,INST HALBLEITERPHYS,DDR-1200 FRANKFURT,GER DEM REP
AKAD WISSENSCH DDR,INST HALBLEITERPHYS,DDR-1200 FRANKFURT,GER DEM REP
TESTOVA, NA
;
TITOV, AA
论文数:
0
引用数:
0
h-index:
0
机构:
AKAD WISSENSCH DDR,INST HALBLEITERPHYS,DDR-1200 FRANKFURT,GER DEM REP
AKAD WISSENSCH DDR,INST HALBLEITERPHYS,DDR-1200 FRANKFURT,GER DEM REP
TITOV, AA
;
MORGENSTERN, T
论文数:
0
引用数:
0
h-index:
0
机构:
AKAD WISSENSCH DDR,INST HALBLEITERPHYS,DDR-1200 FRANKFURT,GER DEM REP
AKAD WISSENSCH DDR,INST HALBLEITERPHYS,DDR-1200 FRANKFURT,GER DEM REP
MORGENSTERN, T
;
KUHNE, H
论文数:
0
引用数:
0
h-index:
0
机构:
AKAD WISSENSCH DDR,INST HALBLEITERPHYS,DDR-1200 FRANKFURT,GER DEM REP
AKAD WISSENSCH DDR,INST HALBLEITERPHYS,DDR-1200 FRANKFURT,GER DEM REP
KUHNE, H
.
CRYSTAL RESEARCH AND TECHNOLOGY,
1985,
20
(12)
:1583
-1593
[3]
AUTODOPING OF EPITAXIAL SILICON LAYERS .2. DIFFUSION-INDUCED AUTODOPING
[J].
KUHNE, H
论文数:
0
引用数:
0
h-index:
0
KUHNE, H
;
GAWORZEWSKI, P
论文数:
0
引用数:
0
h-index:
0
GAWORZEWSKI, P
;
MALZE, W
论文数:
0
引用数:
0
h-index:
0
MALZE, W
.
CRYSTAL RESEARCH AND TECHNOLOGY,
1985,
20
(05)
:635
-644
[4]
TOTAL PRESSURE-DEPENDENCE OF DOPING ELEMENT INCORPORATION DURING THE CHEMICAL VAPOR-DEPOSITION OF EPITAXIAL SILICON
[J].
KUHNE, H
论文数:
0
引用数:
0
h-index:
0
KUHNE, H
.
CRYSTAL RESEARCH AND TECHNOLOGY,
1982,
17
(02)
:181
-187
[5]
COMPUTER-SIMULATION IN SILICON EPITAXY
[J].
REIF, R
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
REIF, R
;
DUTTON, RW
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
DUTTON, RW
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1981,
128
(04)
:909
-918
[6]
KINETICS OF LATERAL AUTO-DOPING IN SILICON EPITAXY
[J].
SRINIVASAN, GR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM System Products Division, East Fishkill Facility, New York 12533, Hopewell Junction
SRINIVASAN, GR
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(01)
:146
-151
[7]
SRINIVASAN GR, 1980, J ELECTROCHEM SOC AM, V127, P1324
[8]
THEORETICAL CALCULATION OF DISTRIBUTION COEFFICIENTS OF IMPURITIES IN GERMANIUM AND SILICON, HEATS OF SOLID SOLUTION
[J].
WEISER, K
论文数:
0
引用数:
0
h-index:
0
WEISER, K
.
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS,
1958,
7
(2-3)
:118
-126
[9]
A TRAPPING MECHANISM FOR AUTODOPING IN SILICON EPITAXY .2. PARAMETER EXTRACTION AND SIMULATIONS
[J].
WONG, M
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
WONG, M
;
REIF, R
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
REIF, R
;
SRINIVASAN, GR
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
SRINIVASAN, GR
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1985,
32
(02)
:89
-94
[10]
A TRAPPING MECHANISM FOR AUTODOPING IN SILICON EPITAXY .1. THEORY
[J].
WONG, M
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
WONG, M
;
REIF, R
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
REIF, R
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1985,
32
(02)
:83
-88
←
1
→
共 10 条
[1]
AUTODOPING OF ANTIMONY AND ARSENIC IN SILICON EPITAXIAL LAYERS
[J].
KATONA, P
论文数:
0
引用数:
0
h-index:
0
KATONA, P
.
THIN SOLID FILMS,
1983,
100
(01)
:9
-15
[2]
DECOMPOSITION EQUILIBRIUM OF ARSINE AND LOW-PRESSURE DOPING OF EPITAXIAL CVD SILICON
[J].
KOKOVIN, GA
论文数:
0
引用数:
0
h-index:
0
机构:
AKAD WISSENSCH DDR,INST HALBLEITERPHYS,DDR-1200 FRANKFURT,GER DEM REP
AKAD WISSENSCH DDR,INST HALBLEITERPHYS,DDR-1200 FRANKFURT,GER DEM REP
KOKOVIN, GA
;
TESTOVA, NA
论文数:
0
引用数:
0
h-index:
0
机构:
AKAD WISSENSCH DDR,INST HALBLEITERPHYS,DDR-1200 FRANKFURT,GER DEM REP
AKAD WISSENSCH DDR,INST HALBLEITERPHYS,DDR-1200 FRANKFURT,GER DEM REP
TESTOVA, NA
;
TITOV, AA
论文数:
0
引用数:
0
h-index:
0
机构:
AKAD WISSENSCH DDR,INST HALBLEITERPHYS,DDR-1200 FRANKFURT,GER DEM REP
AKAD WISSENSCH DDR,INST HALBLEITERPHYS,DDR-1200 FRANKFURT,GER DEM REP
TITOV, AA
;
MORGENSTERN, T
论文数:
0
引用数:
0
h-index:
0
机构:
AKAD WISSENSCH DDR,INST HALBLEITERPHYS,DDR-1200 FRANKFURT,GER DEM REP
AKAD WISSENSCH DDR,INST HALBLEITERPHYS,DDR-1200 FRANKFURT,GER DEM REP
MORGENSTERN, T
;
KUHNE, H
论文数:
0
引用数:
0
h-index:
0
机构:
AKAD WISSENSCH DDR,INST HALBLEITERPHYS,DDR-1200 FRANKFURT,GER DEM REP
AKAD WISSENSCH DDR,INST HALBLEITERPHYS,DDR-1200 FRANKFURT,GER DEM REP
KUHNE, H
.
CRYSTAL RESEARCH AND TECHNOLOGY,
1985,
20
(12)
:1583
-1593
[3]
AUTODOPING OF EPITAXIAL SILICON LAYERS .2. DIFFUSION-INDUCED AUTODOPING
[J].
KUHNE, H
论文数:
0
引用数:
0
h-index:
0
KUHNE, H
;
GAWORZEWSKI, P
论文数:
0
引用数:
0
h-index:
0
GAWORZEWSKI, P
;
MALZE, W
论文数:
0
引用数:
0
h-index:
0
MALZE, W
.
CRYSTAL RESEARCH AND TECHNOLOGY,
1985,
20
(05)
:635
-644
[4]
TOTAL PRESSURE-DEPENDENCE OF DOPING ELEMENT INCORPORATION DURING THE CHEMICAL VAPOR-DEPOSITION OF EPITAXIAL SILICON
[J].
KUHNE, H
论文数:
0
引用数:
0
h-index:
0
KUHNE, H
.
CRYSTAL RESEARCH AND TECHNOLOGY,
1982,
17
(02)
:181
-187
[5]
COMPUTER-SIMULATION IN SILICON EPITAXY
[J].
REIF, R
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
REIF, R
;
DUTTON, RW
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
DUTTON, RW
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1981,
128
(04)
:909
-918
[6]
KINETICS OF LATERAL AUTO-DOPING IN SILICON EPITAXY
[J].
SRINIVASAN, GR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM System Products Division, East Fishkill Facility, New York 12533, Hopewell Junction
SRINIVASAN, GR
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(01)
:146
-151
[7]
SRINIVASAN GR, 1980, J ELECTROCHEM SOC AM, V127, P1324
[8]
THEORETICAL CALCULATION OF DISTRIBUTION COEFFICIENTS OF IMPURITIES IN GERMANIUM AND SILICON, HEATS OF SOLID SOLUTION
[J].
WEISER, K
论文数:
0
引用数:
0
h-index:
0
WEISER, K
.
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS,
1958,
7
(2-3)
:118
-126
[9]
A TRAPPING MECHANISM FOR AUTODOPING IN SILICON EPITAXY .2. PARAMETER EXTRACTION AND SIMULATIONS
[J].
WONG, M
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
WONG, M
;
REIF, R
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
REIF, R
;
SRINIVASAN, GR
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
SRINIVASAN, GR
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1985,
32
(02)
:89
-94
[10]
A TRAPPING MECHANISM FOR AUTODOPING IN SILICON EPITAXY .1. THEORY
[J].
WONG, M
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
WONG, M
;
REIF, R
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
REIF, R
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1985,
32
(02)
:83
-88
←
1
→