EFFECTS IN THE PRESENCE OF DEEP CENTERS ON AN FET-TYPE DEVICE WITH BUFFER LAYER

被引:2
作者
DANSAS, P
机构
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1980年 / 60卷 / 02期
关键词
D O I
10.1002/pssa.2210600235
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:631 / 639
页数:9
相关论文
共 17 条
[1]   IMPROVED METHOD OF DETERMINING DEEP IMPURITY LEVELS AND PROFILES IN SEMICONDUCTORS [J].
GOTO, G ;
YANAGISAWA, S ;
WADA, O ;
TAKANASHI, H .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1974, 13 (07) :1127-1133
[2]   EFFECT OF HEAT-TREATMENT ON NATURE OF TRAPS IN EPITAXIAL GAAS [J].
HASEGAWA, F ;
MAJERFELD, A .
ELECTRONICS LETTERS, 1976, 12 (02) :52-53
[3]   DEEP TRAPPING EFFECTS AT GAAS-GAAS-CR INTERFACE IN GAAS FET STRUCTURES [J].
HOUNG, YM ;
PEARSON, GL .
JOURNAL OF APPLIED PHYSICS, 1978, 49 (06) :3348-3352
[4]  
HUBER A, 1979, J MICROSC SPECT ELEC, V4, P493
[5]   DIRECT EVIDENCE FOR THE NON-ASSIGNMENT TO OXYGEN OF THE MAIN ELECTRON TRAP IN GAAS [J].
HUBER, AM ;
LINH, NT ;
VALLADON, M ;
DEBRUN, JL ;
MARTIN, GM ;
MITONNEAU, A ;
MIRCEA, A .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (06) :4022-4026
[6]   DEEP-LEVEL SPECTROSCOPY IN HIGH-RESISTIVITY MATERIALS [J].
HURTES, C ;
BOULOU, M ;
MITONNEAU, A ;
BOIS, D .
APPLIED PHYSICS LETTERS, 1978, 32 (12) :821-823
[7]  
ITOH T, 1978, 7 S GAAS REL COMP ST, V45, P326
[8]   ELECTRICAL AND PHOTOELECTRONIC PROPERTIES OF CR-DOPED SEMI-INSULATING GAAS [J].
KITAHARA, K ;
NAKAI, K ;
SHIBATOMI, A ;
OHKAWA, S .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (08) :5339-5344
[9]  
LIN AL, 1976, J APPL PHYS, V47, P1859, DOI 10.1063/1.322905
[10]   ELECTRON TRAPS IN BULK AND EPITAXIAL GAAS CRYSTALS [J].
MARTIN, GM ;
MITONNEAU, A ;
MIRCEA, A .
ELECTRONICS LETTERS, 1977, 13 (07) :191-193