EMISSION COEFFICIENTS FOR ELECTRON AND HOLE TRAPS IN SILICON

被引：7

作者：

CHEN, JW ^{[1
]}

MILNES, AG ^{[1
]}

机构：

[1] CARNEGIE MELLON UNIV,DEPT ELECT ENGN,PITTSBURGH,PA 15213

来源：

SOLID-STATE ELECTRONICS | 1979年 / 22卷 / 07期

关键词：

D O I：

10.1016/0038-1101(79)90146-1

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

[No abstract available]

引用

页码：684 / 686

页数：3

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