DELTA DOPING IN SILICON

被引:84
作者
GOSSMANN, HJ
SCHUBERT, EF
机构
[1] AT&T Bell Laboratories, NJ 07974, Murray Hill
关键词
SI; EPITAXIAL GROWTH; DOPANTS IN SI; ELECTRONIC SUBBAND STATES; DELTA-DOPING;
D O I
10.1080/10408439308243415
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Two-dimensional doping sheets (''delta-doping'') are integral parts of many novel semiconductor device concepts. Their practical realization in silicon (Si), however, was long delayed by the difficulty to introduce dopants into Si in a well-controlled way during epitaxial growth. Recent advances in the understanding of epitaxial growth and the incorporation of dopants in Si have overcome these difficulties and opened a new field in Si materials and device research. In this article. we review the growth, processing. and characterization of epitaxially grown delta-doped Si. Furthermore, we discuss the electronic subband states of such structures. Finally, we give an overview of device concepts that use delta-doping and analyze their properties.
引用
收藏
页码:1 / 67
页数:67
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