共 12 条
- [1] ALLEN S, 1975, OPTICAL PROPERTIES H, P503
- [3] GRAY DE, 1972, AM I PHYSICS HDB, P6
- [6] REFRACTIVE INDEX OF ZNSE, ZNTE, + CDTE [J]. JOURNAL OF APPLIED PHYSICS, 1964, 35 (3P1) : 539 - &
- [7] MEASUREMEMT OF THICKNESS AND REFRACTIVE INDEX OF VERY THIN FILMS AND OPTICAL PROPERTIES OF SURFACES BY ELLIPSOMETRY [J]. JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1963, A 67 (04): : 363 - +
- [8] MCCRACKIN FL, 1969, NBS479 TECHN NOT
- [10] ELLIPSOMETRIC STUDIES OF POLISHED SILICON SURFACES [J]. SURFACE SCIENCE, 1976, 55 (02) : 467 - 476