0.1-MU-M-GATE, ULTRATHIN-FILM CMOS DEVICES USING SIMOX SUBSTRATE WITH 80-NM-THICK BURIED OXIDE LAYER

被引:18
作者
OMURA, Y
NAKASHIMA, S
IZUMI, K
ISHII, T
机构
[1] NTT LSI Laboratories, Atsugi, Kanagawa 243-01, 3-1, Morinosato-Wakamiya
关键词
D O I
10.1109/16.210214
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A 0.1-mum-gate CMOS/SIMOX is fabricated using high-quality SIMOX substrates with a sub-100-nm-thick buried oxide layer. In addition, 0.085-mum-gate nMOSFET's/SIMOX and pMOSFET's/SIMOX with 8-nm-thick silicon active layers have been fabricated. The prospects for improving the performance of 0.1-mum-gate CMOS/SIMOX devices are discussed in detail.
引用
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页码:1019 / 1022
页数:4
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