SELECTIVE EPITAXIAL-GROWTH BY MOLECULAR-BEAM EPITAXY

被引:18
作者
OKAMOTO, A
机构
[1] Microelectron. Res. Labs., NEC Corp., Ibaraki
关键词
D O I
10.1088/0268-1242/8/6/007
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Selective epitaxial growth by molecular beam epitaxy (MBE) is realized at rather high substrate temperatures: 700-degrees-C for GaAs and 550-degrees-C for InAs with a growth rate of 0.7 mum h-1. Selectivity depends significantly on growth rate, As pressure and substrate temperature. Growth kinetic studies are carried out. The diffusion length of Ga on SiO2 at 700-degrees-C is estimated to be about 20 to 30 mum. The results demonstrate that selective epitaxial growth by MBE can be used as a device fabrication process where thin localized GaAs or InAs epilayers are required.
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收藏
页码:1011 / 1015
页数:5
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