BULK ELECTROMIGRATION BY ELIMINATING GRAIN-BOUNDARY MASS-FLOW IN CONTINUOUS ALUMINUM LINES

被引：7

作者：

SCHREIBER, HU

机构：

[1] Ruhr-Univ Bochum, Bochum, West Ger, Ruhr-Univ Bochum, Bochum, West Ger

来源：

SOLID-STATE ELECTRONICS | 1986年 / 29卷 / 05期

关键词：

Compendex;

D O I：

10.1016/0038-1101(86)90076-6

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

10

引用

收藏

页码：545 / 549

页数：5

相关论文

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