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ANNEALING OF SE-IMPLANTED GAAS WITH AN OXYGEN-FREE CVD SI3N4 ENCAPSULANT
被引:25
作者
:
INADA, T
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA RES INST TOKYO INC,TAMA KU,KAWASAKI 214,JAPAN
MATSUSHITA RES INST TOKYO INC,TAMA KU,KAWASAKI 214,JAPAN
INADA, T
[
1
]
MIWA, H
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA RES INST TOKYO INC,TAMA KU,KAWASAKI 214,JAPAN
MATSUSHITA RES INST TOKYO INC,TAMA KU,KAWASAKI 214,JAPAN
MIWA, H
[
1
]
KATO, S
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA RES INST TOKYO INC,TAMA KU,KAWASAKI 214,JAPAN
MATSUSHITA RES INST TOKYO INC,TAMA KU,KAWASAKI 214,JAPAN
KATO, S
[
1
]
KOBAYASHI, E
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA RES INST TOKYO INC,TAMA KU,KAWASAKI 214,JAPAN
MATSUSHITA RES INST TOKYO INC,TAMA KU,KAWASAKI 214,JAPAN
KOBAYASHI, E
[
1
]
HARA, T
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA RES INST TOKYO INC,TAMA KU,KAWASAKI 214,JAPAN
MATSUSHITA RES INST TOKYO INC,TAMA KU,KAWASAKI 214,JAPAN
HARA, T
[
1
]
MIHARA, M
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA RES INST TOKYO INC,TAMA KU,KAWASAKI 214,JAPAN
MATSUSHITA RES INST TOKYO INC,TAMA KU,KAWASAKI 214,JAPAN
MIHARA, M
[
1
]
机构
:
[1]
MATSUSHITA RES INST TOKYO INC,TAMA KU,KAWASAKI 214,JAPAN
来源
:
JOURNAL OF APPLIED PHYSICS
|
1978年
/ 49卷
/ 08期
关键词
:
D O I
:
10.1063/1.325472
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:4571 / 4573
页数:3
相关论文
共 12 条
[1]
PROPERTIES OF SIXOYNZ FILMS ON SI
[J].
BROWN, DM
论文数:
0
引用数:
0
h-index:
0
机构:
General Electric Research and Development Center, Schenectady, New York
BROWN, DM
;
GRAY, PV
论文数:
0
引用数:
0
h-index:
0
机构:
General Electric Research and Development Center, Schenectady, New York
GRAY, PV
;
HEUMANN, FK
论文数:
0
引用数:
0
h-index:
0
机构:
General Electric Research and Development Center, Schenectady, New York
HEUMANN, FK
;
PHILIPP, HR
论文数:
0
引用数:
0
h-index:
0
机构:
General Electric Research and Development Center, Schenectady, New York
PHILIPP, HR
;
TAFT, EA
论文数:
0
引用数:
0
h-index:
0
机构:
General Electric Research and Development Center, Schenectady, New York
TAFT, EA
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1968,
115
(03)
:311
-&
[2]
SILICON-ION-IMPLANTED AND SELENIUM-ION-IMPLANTED GAAS REPRODUCIBLY ANNEALED AT TEMPERATURES UP TO 950DEGREESC
[J].
DONNELLY, JP
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
DONNELLY, JP
;
LINDLEY, WT
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
LINDLEY, WT
;
HURWITZ, CE
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
HURWITZ, CE
.
APPLIED PHYSICS LETTERS,
1975,
27
(01)
:41
-43
[3]
LOW-DOSE N-TYPE ION-IMPLANTATION INTO CR-DOPED GAAS SUBSTRATES
[J].
DONNELLY, JP
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
DONNELLY, JP
;
BOZLER, CO
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
BOZLER, CO
;
LINDLEY, WT
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
LINDLEY, WT
.
SOLID-STATE ELECTRONICS,
1977,
20
(03)
:273
-276
[4]
SELENIUM IMPLANTATION IN GAAS
[J].
GAMO, K
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
GAMO, K
;
INADA, T
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
INADA, T
;
KREKELER, S
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
KREKELER, S
;
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
MAYER, JW
;
EISEN, FH
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
EISEN, FH
;
WELCH, BM
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
WELCH, BM
.
SOLID-STATE ELECTRONICS,
1977,
20
(03)
:213
-217
[5]
OUTDIFFUSION THROUGH SILICON OXIDE AND SILICON NITRIDE LAYERS ON GALLIUM ARSENIDE
[J].
GYULAI, J
论文数:
0
引用数:
0
h-index:
0
GYULAI, J
;
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
MAYER, JW
;
MITCHELL, IV
论文数:
0
引用数:
0
h-index:
0
MITCHELL, IV
;
RODRIGUEZ, V
论文数:
0
引用数:
0
h-index:
0
RODRIGUEZ, V
.
APPLIED PHYSICS LETTERS,
1970,
17
(08)
:332
-+
[6]
INFLUENCE OF IMPLANTATION TEMPERATURE AND SURFACE PROTECTION ON TELLURIUM IMPLANTATION IN GAAS
[J].
HARRIS, JS
论文数:
0
引用数:
0
h-index:
0
HARRIS, JS
;
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
MAYER, JW
;
EISEN, FH
论文数:
0
引用数:
0
h-index:
0
EISEN, FH
;
HASKELL, JD
论文数:
0
引用数:
0
h-index:
0
HASKELL, JD
;
WELCH, B
论文数:
0
引用数:
0
h-index:
0
WELCH, B
;
PASHLEY, RD
论文数:
0
引用数:
0
h-index:
0
PASHLEY, RD
.
APPLIED PHYSICS LETTERS,
1972,
21
(12)
:601
-&
[7]
HEMMENT PLF, 1975, ION IMPLANTATION SEM, P27
[8]
INADA T, UNPUBLISHED
[9]
DOUBLE-LAYERED ENCAPSULANT FOR ANNEALING ION-IMPLANTED GAAS UP TO 1100DEGREESC
[J].
论文数:
引用数:
h-index:
机构:
LIDOW, A
;
GIBBONS, JF
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,STANFORD,CA 94305
GIBBONS, JF
;
MAGEE, T
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,STANFORD,CA 94305
MAGEE, T
.
APPLIED PHYSICS LETTERS,
1977,
31
(03)
:158
-161
[10]
ANODIC-OXIDATION OF GAAS AS A TECHNIQUE TO EVALUATE ELECTRICAL CARRIER CONCENTRATION PROFILES
[J].
MULLER, H
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
MULLER, H
;
EISEN, FH
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
EISEN, FH
;
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
MAYER, JW
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1975,
122
(05)
:651
-655
←
1
2
→
共 12 条
[1]
PROPERTIES OF SIXOYNZ FILMS ON SI
[J].
BROWN, DM
论文数:
0
引用数:
0
h-index:
0
机构:
General Electric Research and Development Center, Schenectady, New York
BROWN, DM
;
GRAY, PV
论文数:
0
引用数:
0
h-index:
0
机构:
General Electric Research and Development Center, Schenectady, New York
GRAY, PV
;
HEUMANN, FK
论文数:
0
引用数:
0
h-index:
0
机构:
General Electric Research and Development Center, Schenectady, New York
HEUMANN, FK
;
PHILIPP, HR
论文数:
0
引用数:
0
h-index:
0
机构:
General Electric Research and Development Center, Schenectady, New York
PHILIPP, HR
;
TAFT, EA
论文数:
0
引用数:
0
h-index:
0
机构:
General Electric Research and Development Center, Schenectady, New York
TAFT, EA
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1968,
115
(03)
:311
-&
[2]
SILICON-ION-IMPLANTED AND SELENIUM-ION-IMPLANTED GAAS REPRODUCIBLY ANNEALED AT TEMPERATURES UP TO 950DEGREESC
[J].
DONNELLY, JP
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
DONNELLY, JP
;
LINDLEY, WT
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
LINDLEY, WT
;
HURWITZ, CE
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
HURWITZ, CE
.
APPLIED PHYSICS LETTERS,
1975,
27
(01)
:41
-43
[3]
LOW-DOSE N-TYPE ION-IMPLANTATION INTO CR-DOPED GAAS SUBSTRATES
[J].
DONNELLY, JP
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
DONNELLY, JP
;
BOZLER, CO
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
BOZLER, CO
;
LINDLEY, WT
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
LINDLEY, WT
.
SOLID-STATE ELECTRONICS,
1977,
20
(03)
:273
-276
[4]
SELENIUM IMPLANTATION IN GAAS
[J].
GAMO, K
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
GAMO, K
;
INADA, T
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
INADA, T
;
KREKELER, S
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
KREKELER, S
;
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
MAYER, JW
;
EISEN, FH
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
EISEN, FH
;
WELCH, BM
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
WELCH, BM
.
SOLID-STATE ELECTRONICS,
1977,
20
(03)
:213
-217
[5]
OUTDIFFUSION THROUGH SILICON OXIDE AND SILICON NITRIDE LAYERS ON GALLIUM ARSENIDE
[J].
GYULAI, J
论文数:
0
引用数:
0
h-index:
0
GYULAI, J
;
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
MAYER, JW
;
MITCHELL, IV
论文数:
0
引用数:
0
h-index:
0
MITCHELL, IV
;
RODRIGUEZ, V
论文数:
0
引用数:
0
h-index:
0
RODRIGUEZ, V
.
APPLIED PHYSICS LETTERS,
1970,
17
(08)
:332
-+
[6]
INFLUENCE OF IMPLANTATION TEMPERATURE AND SURFACE PROTECTION ON TELLURIUM IMPLANTATION IN GAAS
[J].
HARRIS, JS
论文数:
0
引用数:
0
h-index:
0
HARRIS, JS
;
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
MAYER, JW
;
EISEN, FH
论文数:
0
引用数:
0
h-index:
0
EISEN, FH
;
HASKELL, JD
论文数:
0
引用数:
0
h-index:
0
HASKELL, JD
;
WELCH, B
论文数:
0
引用数:
0
h-index:
0
WELCH, B
;
PASHLEY, RD
论文数:
0
引用数:
0
h-index:
0
PASHLEY, RD
.
APPLIED PHYSICS LETTERS,
1972,
21
(12)
:601
-&
[7]
HEMMENT PLF, 1975, ION IMPLANTATION SEM, P27
[8]
INADA T, UNPUBLISHED
[9]
DOUBLE-LAYERED ENCAPSULANT FOR ANNEALING ION-IMPLANTED GAAS UP TO 1100DEGREESC
[J].
论文数:
引用数:
h-index:
机构:
LIDOW, A
;
GIBBONS, JF
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,STANFORD,CA 94305
GIBBONS, JF
;
MAGEE, T
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,STANFORD,CA 94305
MAGEE, T
.
APPLIED PHYSICS LETTERS,
1977,
31
(03)
:158
-161
[10]
ANODIC-OXIDATION OF GAAS AS A TECHNIQUE TO EVALUATE ELECTRICAL CARRIER CONCENTRATION PROFILES
[J].
MULLER, H
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
MULLER, H
;
EISEN, FH
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
EISEN, FH
;
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
MAYER, JW
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1975,
122
(05)
:651
-655
←
1
2
→