INSTABILITY PHENOMENA IN THIN INSULATING FILMS ON SILICON

被引：5

作者：

SINGH, BR

SINGH, K

机构：

[1] INDIAN INST TECHNOL, ADV CTR ELECTR SYST, KANPUR 16, UTTAR PRADESH, INDIA

[2] BANARAS HINDU UNIV, DEPT PHYS, VARANASI, UTTAR PRADESH, INDIA

来源：

MICROELECTRONICS RELIABILITY | 1976年 / 15卷 / 05期

关键词：

D O I：

10.1016/0026-2714(76)90600-4

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：385 / 398

页数：14

相关论文

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