A STUDY OF NUCLEATION IN CHEMICALLY GROWN EPITAXIAL SILICON FILMS USING MOLECULAR BEAM TECHNIQUES .3. NUCLEATION RATE MEASUREMENTS AND EFFECT OF OXYGEN ON INITIAL GROWTH BEHAVIOUR

被引:127
作者
JOYCE, BA
BRADLEY, RR
BOOKER, GR
机构
来源
PHILOSOPHICAL MAGAZINE | 1967年 / 15卷 / 138期
关键词
D O I
10.1080/14786436708222757
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:1167 / &
相关论文
共 24 条
[3]   PERFECTION OF EXPITAXIAL SILICON LAYERS GROWN BY PYROLYSIS OF SILANE [J].
BOOKER, GR ;
JOYCE, BA ;
BRADLEY, RR .
PHILOSOPHICAL MAGAZINE, 1964, 10 (108) :1087-&
[4]   A STUDY OF NUCLEATION IN CHEMICALLY GROWN EPITAXIAL SILICON FILMS USING MOLECULAR BEAM TECHNIQUES .2. INITIAL GROWTH BEHAVIOUR ON CLEAN AND CARBON-CONTAMINATED SILICON SUBSTRATES [J].
BOOKER, GR ;
JOYCE, BA .
PHILOSOPHICAL MAGAZINE, 1966, 14 (128) :301-&
[5]   GROWTH OF EPITAXIAL SILICON LAYERS BY VACUUM EVAPORATION .2. INITIAL NUCLEATION AND GROWTH [J].
BOOKER, GR ;
UNVALA, BA .
PHILOSOPHICAL MAGAZINE, 1965, 11 (109) :11-&
[6]   CRYSTALLOGRAPHIC IMPERFECTIONS IN EPITAXIALLY GROWN SILICON [J].
BOOKER, GR ;
STICKLER, R .
JOURNAL OF APPLIED PHYSICS, 1962, 33 (11) :3281-&
[7]   METHOD OF PREPARING SI AND GE SPECIMENS FOR EXAMINATION BY TRANSMISSION ELECTRON MICROSCOPY [J].
BOOKER, GR ;
STICKLER, R .
BRITISH JOURNAL OF APPLIED PHYSICS, 1962, 13 (09) :446-&
[8]   GROWTH MECHANISM AND DEFECT STRUCTURES IN EPITAXIAL SILICON [J].
CHARIG, JM ;
BICKNELL, RW ;
STIRLAND, DJ ;
JOYCE, BA .
PHILOSOPHICAL MAGAZINE, 1962, 7 (83) :1847-&
[9]   STRUCTURE AND ORIGIN OF STACKING FAULTS IN EPITAXIAL SILICON [J].
FINCH, RH ;
QUEISSER, HJ ;
WASHBURN, J ;
THOMAS, G .
JOURNAL OF APPLIED PHYSICS, 1963, 34 (02) :406-&
[10]   HEATS OF FORMATION OF SOME UNSTABLE GASEOUS HYDRIDES [J].
GUNN, SR ;
GREEN, LG .
JOURNAL OF PHYSICAL CHEMISTRY, 1961, 65 (05) :779-&