THEORY AND APPLICATION OF DUAL-TRANSISTOR CHARGE SEPARATION ANALYSIS

被引：67

作者：

FLEETWOOD, DM ^{[1
]}

SHANEYFELT, MR ^{[1
]}

SCHWANK, JR ^{[1
]}

WINOKUR, PS ^{[1
]}

SEXTON, FW ^{[1
]}

机构：

[1] ALLIED SIGNAL AEROSP CO,ALBUQUERQUE,NM 87185

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1989年 / 36卷 / 06期

关键词：

D O I：

10.1109/23.45374

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1816 / 1824

页数：9

共 33 条

[1] HOLE REMOVAL IN THIN-GATE MOSFETS BY TUNNELING [J].

BENEDETTO, JM ;

BOESCH, HE ;

MCLEAN, FB ;

MIZE, JP .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1985, 32 (06) :3916-3920

[2] MOSFET AND MOS CAPACITOR RESPONSES TO IONIZING-RADIATION [J].

BENEDETTO, JM ;

BOESCH, HE .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1984, 31 (06) :1461-1466

[3] TIME-DEPENDENT INTERFACE TRAP EFFECTS IN MOS DEVICES [J].

BOESCH, HE .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1988, 35 (06) :1160-1167

[4]

DRESSENDORFER PV, 1983, J RAD EFFECTS RES EN, V2, P347

[5] DUAL-TRANSISTOR METHOD TO DETERMINE THRESHOLD-VOLTAGE SHIFTS DUE TO OXIDE-TRAPPED CHARGE AND INTERFACE TRAPS IN METAL-OXIDE-SEMICONDUCTOR DEVICES [J].

FLEETWOOD, DM .

APPLIED PHYSICS LETTERS, 1989, 55 (05) :466-468

[6] HIGH-TEMPERATURE SILICON-ON-INSULATOR ELECTRONICS FOR SPACE NUCLEAR-POWER SYSTEMS - REQUIREMENTS AND FEASIBILITY [J].

FLEETWOOD, DM ;

THOME, FV ;

TSAO, SS ;

DRESSENDORFER, PV ;

DANDINI, VJ ;

SCHWANK, JR .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1988, 35 (05) :1099-1112

[7] TOTAL-DOSE HARDNESS ASSURANCE ISSUES FOR SOI MOSFETS [J].

FLEETWOOD, DM ;

TSAO, SS ;

WINOKUR, PS .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1988, 35 (06) :1361-1367

[8] USING LABORATORY X-RAY AND CO-60 IRRADIATIONS TO PREDICT CMOS DEVICE RESPONSE IN STRATEGIC AND SPACE ENVIRONMENTS [J].

FLEETWOOD, DM ;

WINOKUR, PS ;

SCHWANK, JR .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1988, 35 (06) :1497-1505

[9] A REEVALUATION OF WORST-CASE POSTIRRADIATION RESPONSE FOR HARDENED MOS-TRANSISTORS [J].

FLEETWOOD, DM ;

DRESSENDORFER, PV ;

TURPIN, DC .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1987, 34 (06) :1178-1183

[10]

FLEETWOOD DM, UNPUB

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