COMPARISON OF EXPERIMENTAL AND THEORETICAL CARRIER CONCENTRATIONS IN HEAVILY DOPED N-TYPE SILICON

被引:13
作者
FINETTI, M [1 ]
MAZZONE, AM [1 ]
PASSARI, L [1 ]
PIETRA, S [1 ]
SUSI, E [1 ]
机构
[1] CNR, LAMEL, I-40126 BOLOGNA, ITALY
关键词
D O I
10.1063/1.322383
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:4590 / 4592
页数:3
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