共 157 条
[1]
ABELES F, 1950, ANN PHYSIQUE, V12, P596
[2]
IMPROVEMENTS OF PHASE-MODULATED ELLIPSOMETRY
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1989, 60 (01)
:65-77
ACHER, O
;
BIGAN, E
;
DREVILLON, B
.
[3]
OPTICAL-CONSTANTS OF (GAAS)2-20-(ALAS)2-20 SUPERLATTICES
[J].
PHYSICA A,
1989, 157 (01)
:407-410
ANMA, H
;
YAMAGUCHI, T
;
OKUMURA, H
;
YOSHIDA, S
.
[4]
[Anonymous], 1995, PROGR OPTICS
[6]
Aspnes D. E., 1973, Optics Communications, V8, P222, DOI 10.1016/0030-4018(73)90132-6
[7]
DIELECTRIC FUNCTION AND SURFACE MICROROUGHNESS MEASUREMENTS OF INSB BY SPECTROSCOPIC ELLIPSOMETRY
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1980, 17 (05)
:1057-1060
ASPNES, DE
.
[8]
OPTIMIZING PRECISION OF ROTATING-ANALYZER ELLIPSOMETERS
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1974, 64 (05)
:639-646
ASPNES, DE
.
[9]
PRECISION BOUNDS TO ELLIPSOMETER SYSTEMS
[J].
APPLIED OPTICS,
1975, 14 (05)
:1131-1136
ASPNES, DE
.
[10]
NEW DEVELOPMENTS IN SPECTROELLIPSOMETRY - THE CHALLENGE OF SURFACES
[J].
THIN SOLID FILMS,
1993, 233 (1-2)
:1-8
ASPNES, DE
.