InGaN/GaN/AlGaN-based laser diodes grown an GaN substrates with a fundamental transverse made

被引:93
作者
Nakamura, S [1 ]
Senoh, M [1 ]
Nagahama, S [1 ]
Iwasa, N [1 ]
Yamada, T [1 ]
Matsushita, T [1 ]
Kiyoku, H [1 ]
Sugimoto, Y [1 ]
Kozaki, T [1 ]
Umemoto, H [1 ]
Sano, M [1 ]
Chocho, K [1 ]
机构
[1] Nichia Chem Ind Ltd, Dept Res & Dev, Tokushima 774, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1998年 / 37卷 / 9AB期
关键词
GaN; InGaN; quantum well; laser; lifetime; transverse mode; GaN substrate;
D O I
10.1143/JJAP.37.L1020
中图分类号
O59 [应用物理学];
学科分类号
摘要
An InGaN multiquantum-well (MQW)-structure laser diode (LD) was erown on an epitaxially laterally overgrown GaN un sapphire. The lowest threshold current densities between 1.2 and 2.8 kA/cm(2) were obtained when the number of InGaN well layers was two. The InGaN MQW LD was grown an a free-standing GaN substrate that was obtained by removing the sapphire substrate. The LDs with cleaved mirror facets showed an output power as high as 30 mW under room-temperature continuous-wave (CW) operation. The stable fundamental transverse mode was observed by reducing the ridge width to a value as small as 2 mu m. The lifetime of the LDs at a constant output power of 5 mW was about 160 h under CW operation at an ambient temperature of 50 degrees C, due to a high threshold current density of 6 kA/cm(2).
引用
收藏
页码:L1020 / L1022
页数:3
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