Low-temperature growth of InN films on (111)GaAs substrates

被引:32
作者
Guo, QX [1 ]
Nishio, M
Ogawa, H
Yoshida, A
机构
[1] Saga Univ, Fac Sci & Engn, Dept Elect & Elect Engn, Saga 8408502, Japan
[2] Toyohashi Univ Technol, Dept Elect & Elect Engn, Toyohashi, Aichi 4418580, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1999年 / 38卷 / 5A期
关键词
InN; reactive sputtering; low-temperature growth; GaAs substrate;
D O I
10.1143/JJAP.38.L490
中图分类号
O59 [应用物理学];
学科分类号
摘要
InN films have been frown on (111)GaAs substrates by radio frequency magnetron sputtering, It is revealed that epitaxial InN films with wurtzite structure can be obtained at a growth temperature as low as 100 degrees C. InN grown directly on (111)GaAs is highly oriented in the c-plane, but lacks in-plane uniformity. A buffer layer formed by presputtering the substrate in nitrogen plasma can significantly improve the in-plane orientation, producing single-crystal InN.
引用
收藏
页码:L490 / L491
页数:2
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