CALCULATED AND MEASURED INFRARED REFLECTIVITY OF DIFFUSED IMPLANTED P-TYPE SILICON LAYERS

被引：10

作者：

BARTA, E ^{[1
]}

LUX, G ^{[1
]}

机构：

[1] TUNGSRAM CO,H-1340 BUDAPEST,HUNGARY

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1983年 / 16卷 / 08期

关键词：

D O I：

10.1088/0022-3727/16/8/021

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1543 / 1553

页数：11

共 16 条

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