INVESTIGATION OF GLASSES USING SURFACE PROFILING BY SPECTROCHEMICAL ANALYSIS OF SPUTTER-INDUCED RADIATION .1. SURFACE PROFILING TECHNIQUE WITH HIGH IN-DEPTH RESOLUTION

被引：25

作者：

BACH, H

BAUCKE, FGK

机构：

来源：

JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 1982年 / 65卷 / 11期

关键词：

D O I：

10.1111/j.1151-2916.1982.tb10776.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

收藏

页码：527 / 533

页数：7

相关论文

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