SCHOTTKY-BARRIER MOBILITY PROFILING MEASUREMENTS WITH GATE-CURRENT CORRECTIONS

被引：6

作者：

LOOK, DC

COOPER, TA

机构：

[1] Wright State Univ, Univ Research, Cent, Dayton, OH, USA, Wright State Univ, Univ Research Cent, Dayton, OH, USA

来源：

SOLID-STATE ELECTRONICS | 1985年 / 28卷 / 05期

关键词：

SCHOTTKY-BARRIER GATE - SCHOTTKY-BARRIER MOBILITY;

D O I：

10.1016/0038-1101(85)90117-0

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：521 / 527

页数：7

共 13 条

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