COMPOSITION AND CHEMICAL-BONDS IN SILICON-NITRIDE BY SIH4-N2 GAS-MIXTURE PLASMA CVD

被引:25
作者
FUJITA, S
ZHOU, NS
SASAKI, A
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1983年 / 22卷 / 02期
关键词
D O I
10.1143/JJAP.22.L100
中图分类号
O59 [应用物理学];
学科分类号
摘要
Plasma CVD silicon nitride films are produced from SiH//4-N//2 gas mixture with a constant flow ratio SiH//4/N//2 equals 0. 1. When the pressure decreases and the substrate temperature increases, the Si/N composition approaches the stoichiometric value 0. 75. As compared with the film deposited from SiH//4-NH//3 reaction, the present ammonia-free silicon nitride contains little N-H bonds and less hydrogen, and can be expected to have higher atom concentration and tight bondings.
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页码:L100 / L102
页数:3
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