RUTHERFORD BACKSCATTERING SPECTROSCOPY AND ELECTRON-MICROPROBE ANALYSES OF ARGON GAS TRAPPED IN ALUMINA THIN-FILMS

被引：4

作者：

GIGNAC, LM

RISBUD, SH

机构：

来源：

APPLIED PHYSICS LETTERS | 1989年 / 54卷 / 02期

关键词：

D O I：

10.1063/1.101439

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：129 / 130

页数：2

共 17 条

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