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LINE RESOLUTION IN THE SUB-10-NANOMETER RANGE IN SAM
被引:18
作者
:
CAZAUX, J
论文数:
0
引用数:
0
h-index:
0
机构:
THOMSON CSF,CENT RECH LAB,F-91401 ORSAY,FRANCE
THOMSON CSF,CENT RECH LAB,F-91401 ORSAY,FRANCE
CAZAUX, J
[
1
]
CHAZELAS, J
论文数:
0
引用数:
0
h-index:
0
机构:
THOMSON CSF,CENT RECH LAB,F-91401 ORSAY,FRANCE
THOMSON CSF,CENT RECH LAB,F-91401 ORSAY,FRANCE
CHAZELAS, J
[
1
]
CHARASSE, MN
论文数:
0
引用数:
0
h-index:
0
机构:
THOMSON CSF,CENT RECH LAB,F-91401 ORSAY,FRANCE
THOMSON CSF,CENT RECH LAB,F-91401 ORSAY,FRANCE
CHARASSE, MN
[
1
]
HIRTZ, JP
论文数:
0
引用数:
0
h-index:
0
机构:
THOMSON CSF,CENT RECH LAB,F-91401 ORSAY,FRANCE
THOMSON CSF,CENT RECH LAB,F-91401 ORSAY,FRANCE
HIRTZ, JP
[
1
]
机构
:
[1]
THOMSON CSF,CENT RECH LAB,F-91401 ORSAY,FRANCE
来源
:
ULTRAMICROSCOPY
|
1988年
/ 25卷
/ 01期
关键词
:
D O I
:
10.1016/0304-3991(88)90403-2
中图分类号
:
TH742 [显微镜];
学科分类号
:
摘要
:
引用
收藏
页码:31 / 34
页数:4
相关论文
共 10 条
[1]
MATHEMATICAL AND PHYSICAL CONSIDERATIONS ON THE SPATIAL-RESOLUTION IN SCANNING AUGER-ELECTRON MICROSCOPY
CAZAUX, J
论文数:
0
引用数:
0
h-index:
0
CAZAUX, J
[J].
SURFACE SCIENCE,
1983,
125
(02)
: 335
-
354
[2]
CAZAUX J, 1987, J MICROSC-OXFORD, V145, P257
[3]
AUGER SIGNAL-TO-BACKGROUND RATIO FOR INCIDENT BEAM VOLTAGES RANGING FROM 30 KEV UP TO 100 KEV
CHAZELAS, J
论文数:
0
引用数:
0
h-index:
0
CHAZELAS, J
FRIEDERICH, A
论文数:
0
引用数:
0
h-index:
0
FRIEDERICH, A
CAZAUX, J
论文数:
0
引用数:
0
h-index:
0
CAZAUX, J
[J].
SURFACE AND INTERFACE ANALYSIS,
1988,
11
(1-2)
: 36
-
39
[4]
MONTE-CARLO CALCULATIONS OF SPATIAL-RESOLUTION IN A SCANNING AUGER-ELECTRON MICROSCOPE
ELGOMATI, MM
论文数:
0
引用数:
0
h-index:
0
ELGOMATI, MM
PRUTTON, M
论文数:
0
引用数:
0
h-index:
0
PRUTTON, M
[J].
SURFACE SCIENCE,
1978,
72
(03)
: 485
-
494
[5]
INTERPRETATION OF THE SPATIAL-RESOLUTION OF THE SCANNING AUGER-ELECTRON MICROSCOPE - THEORY-EXPERIMENT COMPARISON
ELGOMATI, MM
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Physics, University of York, Heslington, York
ELGOMATI, MM
JANSSEN, AP
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Physics, University of York, Heslington, York
JANSSEN, AP
PRUTTON, M
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Physics, University of York, Heslington, York
PRUTTON, M
VENABLES, JA
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Physics, University of York, Heslington, York
VENABLES, JA
[J].
SURFACE SCIENCE,
1979,
85
(02)
: 309
-
316
[6]
EFFECT OF BACKSCATTERED ELECTRONS ON RESOLUTION OF SCANNING AUGER MICROSCOPY
JANSSEN, AP
论文数:
0
引用数:
0
h-index:
0
JANSSEN, AP
VENABLES, JA
论文数:
0
引用数:
0
h-index:
0
VENABLES, JA
[J].
SURFACE SCIENCE,
1978,
77
(02)
: 351
-
364
[7]
AUGER ELECTRON SPECTROSCOPY IN SCANNING ELECTRON MICROSCOPE - AUGER ELECTRON IMAGES
MACDONALD, NC
论文数:
0
引用数:
0
h-index:
0
MACDONALD, NC
WALDROP, JR
论文数:
0
引用数:
0
h-index:
0
WALDROP, JR
[J].
APPLIED PHYSICS LETTERS,
1971,
19
(09)
: 315
-
+
[8]
TECHNIQUES FOR THE CORRECTION OF TOPOGRAPHICAL EFFECTS IN SCANNING AUGER-ELECTRON MICROSCOPY
PRUTTON, M
论文数:
0
引用数:
0
h-index:
0
机构:
NASA,AMES RES CTR,STANFORD NASA JOINT INST SURFACE & MICROSTRUCT RES,MOFFETT FIELD,CA 94035
NASA,AMES RES CTR,STANFORD NASA JOINT INST SURFACE & MICROSTRUCT RES,MOFFETT FIELD,CA 94035
PRUTTON, M
LARSON, LA
论文数:
0
引用数:
0
h-index:
0
机构:
NASA,AMES RES CTR,STANFORD NASA JOINT INST SURFACE & MICROSTRUCT RES,MOFFETT FIELD,CA 94035
NASA,AMES RES CTR,STANFORD NASA JOINT INST SURFACE & MICROSTRUCT RES,MOFFETT FIELD,CA 94035
LARSON, LA
POPPA, H
论文数:
0
引用数:
0
h-index:
0
机构:
NASA,AMES RES CTR,STANFORD NASA JOINT INST SURFACE & MICROSTRUCT RES,MOFFETT FIELD,CA 94035
NASA,AMES RES CTR,STANFORD NASA JOINT INST SURFACE & MICROSTRUCT RES,MOFFETT FIELD,CA 94035
POPPA, H
[J].
JOURNAL OF APPLIED PHYSICS,
1983,
54
(01)
: 374
-
381
[9]
AUGER-ELECTRON SPECTROSCOPY AT HIGH SPATIAL-RESOLUTION AND NA PRIMARY BEAM CURRENTS
TODD, G
论文数:
0
引用数:
0
h-index:
0
机构:
NASA,AMES RES CTR,MOFFETT FIELD,CA 94035
TODD, G
POPPA, H
论文数:
0
引用数:
0
h-index:
0
机构:
NASA,AMES RES CTR,MOFFETT FIELD,CA 94035
POPPA, H
MOORHEAD, D
论文数:
0
引用数:
0
h-index:
0
机构:
NASA,AMES RES CTR,MOFFETT FIELD,CA 94035
MOORHEAD, D
BALES, M
论文数:
0
引用数:
0
h-index:
0
机构:
NASA,AMES RES CTR,MOFFETT FIELD,CA 94035
BALES, M
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1975,
12
(04):
: 953
-
955
[10]
HIGH SPATIAL-RESOLUTION AUGER LINESCANS ACROSS HETEROGENEOUS CHEMICAL EDGES BY MONTE-CARLO CALCULATION
TUPPEN, CG
论文数:
0
引用数:
0
h-index:
0
机构:
British Telecom Research Lab, Ipswich, Engl, British Telecom Research Lab, Ipswich, Engl
TUPPEN, CG
DAVIES, GJ
论文数:
0
引用数:
0
h-index:
0
机构:
British Telecom Research Lab, Ipswich, Engl, British Telecom Research Lab, Ipswich, Engl
DAVIES, GJ
[J].
SURFACE AND INTERFACE ANALYSIS,
1985,
7
(05)
: 235
-
240
←
1
→
共 10 条
[1]
MATHEMATICAL AND PHYSICAL CONSIDERATIONS ON THE SPATIAL-RESOLUTION IN SCANNING AUGER-ELECTRON MICROSCOPY
CAZAUX, J
论文数:
0
引用数:
0
h-index:
0
CAZAUX, J
[J].
SURFACE SCIENCE,
1983,
125
(02)
: 335
-
354
[2]
CAZAUX J, 1987, J MICROSC-OXFORD, V145, P257
[3]
AUGER SIGNAL-TO-BACKGROUND RATIO FOR INCIDENT BEAM VOLTAGES RANGING FROM 30 KEV UP TO 100 KEV
CHAZELAS, J
论文数:
0
引用数:
0
h-index:
0
CHAZELAS, J
FRIEDERICH, A
论文数:
0
引用数:
0
h-index:
0
FRIEDERICH, A
CAZAUX, J
论文数:
0
引用数:
0
h-index:
0
CAZAUX, J
[J].
SURFACE AND INTERFACE ANALYSIS,
1988,
11
(1-2)
: 36
-
39
[4]
MONTE-CARLO CALCULATIONS OF SPATIAL-RESOLUTION IN A SCANNING AUGER-ELECTRON MICROSCOPE
ELGOMATI, MM
论文数:
0
引用数:
0
h-index:
0
ELGOMATI, MM
PRUTTON, M
论文数:
0
引用数:
0
h-index:
0
PRUTTON, M
[J].
SURFACE SCIENCE,
1978,
72
(03)
: 485
-
494
[5]
INTERPRETATION OF THE SPATIAL-RESOLUTION OF THE SCANNING AUGER-ELECTRON MICROSCOPE - THEORY-EXPERIMENT COMPARISON
ELGOMATI, MM
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Physics, University of York, Heslington, York
ELGOMATI, MM
JANSSEN, AP
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Physics, University of York, Heslington, York
JANSSEN, AP
PRUTTON, M
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Physics, University of York, Heslington, York
PRUTTON, M
VENABLES, JA
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Physics, University of York, Heslington, York
VENABLES, JA
[J].
SURFACE SCIENCE,
1979,
85
(02)
: 309
-
316
[6]
EFFECT OF BACKSCATTERED ELECTRONS ON RESOLUTION OF SCANNING AUGER MICROSCOPY
JANSSEN, AP
论文数:
0
引用数:
0
h-index:
0
JANSSEN, AP
VENABLES, JA
论文数:
0
引用数:
0
h-index:
0
VENABLES, JA
[J].
SURFACE SCIENCE,
1978,
77
(02)
: 351
-
364
[7]
AUGER ELECTRON SPECTROSCOPY IN SCANNING ELECTRON MICROSCOPE - AUGER ELECTRON IMAGES
MACDONALD, NC
论文数:
0
引用数:
0
h-index:
0
MACDONALD, NC
WALDROP, JR
论文数:
0
引用数:
0
h-index:
0
WALDROP, JR
[J].
APPLIED PHYSICS LETTERS,
1971,
19
(09)
: 315
-
+
[8]
TECHNIQUES FOR THE CORRECTION OF TOPOGRAPHICAL EFFECTS IN SCANNING AUGER-ELECTRON MICROSCOPY
PRUTTON, M
论文数:
0
引用数:
0
h-index:
0
机构:
NASA,AMES RES CTR,STANFORD NASA JOINT INST SURFACE & MICROSTRUCT RES,MOFFETT FIELD,CA 94035
NASA,AMES RES CTR,STANFORD NASA JOINT INST SURFACE & MICROSTRUCT RES,MOFFETT FIELD,CA 94035
PRUTTON, M
LARSON, LA
论文数:
0
引用数:
0
h-index:
0
机构:
NASA,AMES RES CTR,STANFORD NASA JOINT INST SURFACE & MICROSTRUCT RES,MOFFETT FIELD,CA 94035
NASA,AMES RES CTR,STANFORD NASA JOINT INST SURFACE & MICROSTRUCT RES,MOFFETT FIELD,CA 94035
LARSON, LA
POPPA, H
论文数:
0
引用数:
0
h-index:
0
机构:
NASA,AMES RES CTR,STANFORD NASA JOINT INST SURFACE & MICROSTRUCT RES,MOFFETT FIELD,CA 94035
NASA,AMES RES CTR,STANFORD NASA JOINT INST SURFACE & MICROSTRUCT RES,MOFFETT FIELD,CA 94035
POPPA, H
[J].
JOURNAL OF APPLIED PHYSICS,
1983,
54
(01)
: 374
-
381
[9]
AUGER-ELECTRON SPECTROSCOPY AT HIGH SPATIAL-RESOLUTION AND NA PRIMARY BEAM CURRENTS
TODD, G
论文数:
0
引用数:
0
h-index:
0
机构:
NASA,AMES RES CTR,MOFFETT FIELD,CA 94035
TODD, G
POPPA, H
论文数:
0
引用数:
0
h-index:
0
机构:
NASA,AMES RES CTR,MOFFETT FIELD,CA 94035
POPPA, H
MOORHEAD, D
论文数:
0
引用数:
0
h-index:
0
机构:
NASA,AMES RES CTR,MOFFETT FIELD,CA 94035
MOORHEAD, D
BALES, M
论文数:
0
引用数:
0
h-index:
0
机构:
NASA,AMES RES CTR,MOFFETT FIELD,CA 94035
BALES, M
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1975,
12
(04):
: 953
-
955
[10]
HIGH SPATIAL-RESOLUTION AUGER LINESCANS ACROSS HETEROGENEOUS CHEMICAL EDGES BY MONTE-CARLO CALCULATION
TUPPEN, CG
论文数:
0
引用数:
0
h-index:
0
机构:
British Telecom Research Lab, Ipswich, Engl, British Telecom Research Lab, Ipswich, Engl
TUPPEN, CG
DAVIES, GJ
论文数:
0
引用数:
0
h-index:
0
机构:
British Telecom Research Lab, Ipswich, Engl, British Telecom Research Lab, Ipswich, Engl
DAVIES, GJ
[J].
SURFACE AND INTERFACE ANALYSIS,
1985,
7
(05)
: 235
-
240
←
1
→