ELECTROMIGRATION MEASURING TECHNIQUES FOR GRAIN-BOUNDARY DIFFUSION ACTIVATION-ENERGY IN ALUMINUM

被引：55

作者：

SCHREIBER, HU

GRABE, B

机构：

来源：

SOLID-STATE ELECTRONICS | 1981年 / 24卷 / 12期

关键词：

D O I：

10.1016/0038-1101(81)90182-9

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1135 / 1146

页数：12

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