HIGH-CONCENTRATION NITROGEN DOPING IN MOVPE GROWN ZNSE

被引:13
作者
OHKI, A
SHIBATA, N
ANDO, K
KATSUI, A
机构
[1] NTT Optoelectronics Laboratories, Tokai, Ibaraki-ken
关键词
D O I
10.1016/0022-0248(90)90554-X
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Nitrogen-doped ZnSe films have been grown on (100) GaAs substrates by MOVPE using diethylzinc (DEZ) and hydrogen selenide as reactants. NH3 gas was used as a dopant source. The nitrogen concentrations of these films, determined using SIMS (secondary ion mass spectroscopy) analysis, were up to 2×1019 cm-3. PL spectra and X-ray diffraction measurements have revealed marked changes in both film crystallinities and PL characteristics. Nitrogen doping exceeding 1×1018 cm-3 causes a deterioration of film crystallinity due to the formation of nitrogen related complex defects. It is found that the thermal annealing after growth was effective for the recovery of the crystallinity of the nitrogen-dopen ZnSe films. © 1990.
引用
收藏
页码:413 / 417
页数:5
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