CHARACTERISTICS OF SI-DOPED GAAS EPILAYERS GROWN BY METALORGANIC CHEMICAL VAPOR-DEPOSITION USING A SILANE SOURCE

被引:9
作者
LIU, CW
CHEN, SL
LAY, JP
LEE, SC
LIN, HH
机构
关键词
D O I
10.1063/1.98579
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1634 / 1636
页数:3
相关论文
共 15 条
[1]   DEPENDENCE OF GROWTH PROPERTIES OF SILICON-DOPED GAAS EPITAXIAL LAYERS UPON ORIENTATION [J].
AHN, BH ;
SHURTZ, RR ;
TRUSSELL, CW .
JOURNAL OF APPLIED PHYSICS, 1971, 42 (11) :4512-&
[2]   CRYSTAL ORIENTATION DEPENDENCE OF SILICON AUTOCOMPENSATION IN MOLECULAR-BEAM EPITAXIAL GALLIUM-ARSENIDE [J].
BALLINGALL, JM ;
WOOD, CEC .
APPLIED PHYSICS LETTERS, 1982, 41 (10) :947-949
[3]   SILICON AND GERMANIUM DOPING OF EPITAXIAL GALLIUM-ARSENIDE GROWN BY THE TRIMETHYLGALLIUM-ARSINE METHOD [J].
BASS, SJ .
JOURNAL OF CRYSTAL GROWTH, 1979, 47 (5-6) :613-618
[4]  
BOSE S, UNPUB
[5]   ENHANCEMENT OF GROWTH-RATE DUE TO TIN DOPING IN GAAS EPILAYER GROWN BY LOW-PRESSURE METAL-ORGANIC CHEMICAL VAPOR-DEPOSITION [J].
CHANG, CY ;
LEE, MK ;
SU, YK ;
HSU, WC .
JOURNAL OF APPLIED PHYSICS, 1983, 54 (09) :5464-5465
[6]   KINETICS OF SILICON DEPOSITION ON SILICON BY PYROLYSIS OF SILANE - MASS-SPECTROMETRIC INVESTIGATION BY MOLECULAR-BEAM SAMPLING [J].
FARROW, RFC .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1974, 121 (07) :899-907
[7]   CARRIER CONCENTRATION PROFILES IN SI-DOPED LIQUID-PHASE EPITAXIAL GA1-XALXAS [J].
JOHNSON, WJ ;
RADO, WG ;
CRAWLEY, RL ;
AMEY, JE .
JOURNAL OF APPLIED PHYSICS, 1973, 44 (03) :1311-1315
[8]   PROPERTIES OF EFFICIENT SILICON-COMPENSATED ALXGA1-XAS ELECTROLUMINESCENT DIODES [J].
KRESSEL, H ;
HAWRYLO, FZ ;
ALMELEH, N .
JOURNAL OF APPLIED PHYSICS, 1969, 40 (05) :2248-&
[9]   DISILANE - A NEW SILICON DOPING SOURCE IN METALORGANIC CHEMICAL VAPOR-DEPOSITION OF GAAS [J].
KUECH, TF ;
MEYERSON, BS ;
VEUHOFF, E .
APPLIED PHYSICS LETTERS, 1984, 44 (10) :986-988
[10]   INVESTIGATION OF SN-DOPED GAAS EPILAYERS GROWN BY LOW-PRESSURE METAL-ORGANIC CHEMICAL VAPOR-DEPOSITION [J].
LEE, MK ;
CHANG, CY ;
SU, YK .
APPLIED PHYSICS LETTERS, 1983, 42 (01) :88-89