CORRELATION BETWEEN MECHANICAL-STRESS AND HYDROGEN-RELATED EFFECTS ON RADIATION-INDUCED DAMAGE IN MOS STRUCTURES

被引：11

作者：

KASAMA, K

TSUKIJI, M

KOBAYASHI, K

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1987年 / 34卷 / 06期

关键词：

D O I：

10.1109/TNS.1987.4337453

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1202 / 1207

页数：6

共 22 条

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