An ultra-high-speed optoetectronic integrated receiver consisting of a GaInAs p-i-n photodiode and a transimpedance AlInAs/GaInAs high-electron-mobility-transistor amplifier has been successfully fabricated on an InP substrate. A 3-dB bandwidth of 6 GHz with a transimpedance of 50 dB-OMEGA was achieved for the receiver with a feedback resistance of 750-OMEGA. Measured noise currents of the receiver were analyzed and found to be dominated by the low-frequency noise and the induced gate noise. The sensitivity of -21.2 dBm for 8.0-Gb/s NRZ signals was deduced from the noise current characteristics.