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CHEMICAL VAPOR-DEPOSITION OF SILICON-NITRIDE - ENCAPSULANT LAYERS FOR ANNEALING GALLIUM-ARSENIDE
被引:33
作者
:
INADA, T
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA RES INST TOKYO INC,TAMA KU,KAWASAKI 214,JAPAN
INADA, T
OHKUBO, T
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA RES INST TOKYO INC,TAMA KU,KAWASAKI 214,JAPAN
OHKUBO, T
SAWADA, S
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA RES INST TOKYO INC,TAMA KU,KAWASAKI 214,JAPAN
SAWADA, S
HARA, T
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA RES INST TOKYO INC,TAMA KU,KAWASAKI 214,JAPAN
HARA, T
NAKAJIMA, M
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA RES INST TOKYO INC,TAMA KU,KAWASAKI 214,JAPAN
NAKAJIMA, M
机构
:
[1]
MATSUSHITA RES INST TOKYO INC,TAMA KU,KAWASAKI 214,JAPAN
[2]
MATSUSHITA ELECT IND CO LTD,CENT RES LAB,MORIGUCHI,OSAKA 570,JAPAN
来源
:
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
|
1978年
/ 125卷
/ 09期
关键词
:
D O I
:
10.1149/1.2131709
中图分类号
:
O646 [电化学、电解、磁化学];
学科分类号
:
081704 ;
摘要
:
引用
收藏
页码:1525 / 1529
页数:5
相关论文
共 19 条
[1]
THERMAL EXPANSION OF SPUTTERED SILICON NITRIDE FILMS
BURKHARDT, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Components Division, East Fishkill Laboratory, Hopewell Junction, New York
BURKHARDT, PJ
MARVEL, RF
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Components Division, East Fishkill Laboratory, Hopewell Junction, New York
MARVEL, RF
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1969,
116
(06)
: 864
-
+
[2]
PREPARATION AND PROPERTIES OF AMORPHOUS SILICON NITRIDE FILMS
CHU, TL
论文数:
0
引用数:
0
h-index:
0
CHU, TL
LEE, CH
论文数:
0
引用数:
0
h-index:
0
LEE, CH
GRUBER, GA
论文数:
0
引用数:
0
h-index:
0
GRUBER, GA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1967,
114
(07)
: 717
-
&
[3]
SILICON-ION-IMPLANTED AND SELENIUM-ION-IMPLANTED GAAS REPRODUCIBLY ANNEALED AT TEMPERATURES UP TO 950DEGREESC
DONNELLY, JP
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
DONNELLY, JP
LINDLEY, WT
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
LINDLEY, WT
HURWITZ, CE
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
HURWITZ, CE
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(01)
: 41
-
43
[4]
DONNELLY JP, 1976, GALLIUM ARSENIDE REL, P336
[5]
PROPERTY CHANGES IN PYROLYTIC SILICON NITRIDE WITH REACTANT COMPOSITION CHANGES
DOO, VY
论文数:
0
引用数:
0
h-index:
0
DOO, VY
KERR, DR
论文数:
0
引用数:
0
h-index:
0
KERR, DR
NICHOLS, DR
论文数:
0
引用数:
0
h-index:
0
NICHOLS, DR
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1968,
115
(01)
: 61
-
&
[6]
PREPARATION AND PROPERTIES OF PYROLYTIC SILICON NITRIDE
DOO, VY
论文数:
0
引用数:
0
h-index:
0
DOO, VY
NICHOLS, DR
论文数:
0
引用数:
0
h-index:
0
NICHOLS, DR
SILVEY, GA
论文数:
0
引用数:
0
h-index:
0
SILVEY, GA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1966,
113
(12)
: 1279
-
&
[7]
SELENIUM IMPLANTATION IN GAAS
GAMO, K
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
GAMO, K
INADA, T
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
INADA, T
KREKELER, S
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
KREKELER, S
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
MAYER, JW
EISEN, FH
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
EISEN, FH
WELCH, BM
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
WELCH, BM
[J].
SOLID-STATE ELECTRONICS,
1977,
20
(03)
: 213
-
217
[8]
OUTDIFFUSION THROUGH SILICON OXIDE AND SILICON NITRIDE LAYERS ON GALLIUM ARSENIDE
GYULAI, J
论文数:
0
引用数:
0
h-index:
0
GYULAI, J
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
MAYER, JW
MITCHELL, IV
论文数:
0
引用数:
0
h-index:
0
MITCHELL, IV
RODRIGUEZ, V
论文数:
0
引用数:
0
h-index:
0
RODRIGUEZ, V
[J].
APPLIED PHYSICS LETTERS,
1970,
17
(08)
: 332
-
+
[9]
HEMMENT PLF, 1975, ION IMPLANTATION SEM, P27
[10]
QUANTITATIVE DETECTION OF OXYGEN IN SILICON-NITRIDE ON SILICON
HOLLOWAY, PH
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
HOLLOWAY, PH
STEIN, HJ
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
STEIN, HJ
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1976,
123
(05)
: 723
-
728
←
1
2
→
共 19 条
[1]
THERMAL EXPANSION OF SPUTTERED SILICON NITRIDE FILMS
BURKHARDT, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Components Division, East Fishkill Laboratory, Hopewell Junction, New York
BURKHARDT, PJ
MARVEL, RF
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Components Division, East Fishkill Laboratory, Hopewell Junction, New York
MARVEL, RF
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1969,
116
(06)
: 864
-
+
[2]
PREPARATION AND PROPERTIES OF AMORPHOUS SILICON NITRIDE FILMS
CHU, TL
论文数:
0
引用数:
0
h-index:
0
CHU, TL
LEE, CH
论文数:
0
引用数:
0
h-index:
0
LEE, CH
GRUBER, GA
论文数:
0
引用数:
0
h-index:
0
GRUBER, GA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1967,
114
(07)
: 717
-
&
[3]
SILICON-ION-IMPLANTED AND SELENIUM-ION-IMPLANTED GAAS REPRODUCIBLY ANNEALED AT TEMPERATURES UP TO 950DEGREESC
DONNELLY, JP
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
DONNELLY, JP
LINDLEY, WT
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
LINDLEY, WT
HURWITZ, CE
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
HURWITZ, CE
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(01)
: 41
-
43
[4]
DONNELLY JP, 1976, GALLIUM ARSENIDE REL, P336
[5]
PROPERTY CHANGES IN PYROLYTIC SILICON NITRIDE WITH REACTANT COMPOSITION CHANGES
DOO, VY
论文数:
0
引用数:
0
h-index:
0
DOO, VY
KERR, DR
论文数:
0
引用数:
0
h-index:
0
KERR, DR
NICHOLS, DR
论文数:
0
引用数:
0
h-index:
0
NICHOLS, DR
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1968,
115
(01)
: 61
-
&
[6]
PREPARATION AND PROPERTIES OF PYROLYTIC SILICON NITRIDE
DOO, VY
论文数:
0
引用数:
0
h-index:
0
DOO, VY
NICHOLS, DR
论文数:
0
引用数:
0
h-index:
0
NICHOLS, DR
SILVEY, GA
论文数:
0
引用数:
0
h-index:
0
SILVEY, GA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1966,
113
(12)
: 1279
-
&
[7]
SELENIUM IMPLANTATION IN GAAS
GAMO, K
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
GAMO, K
INADA, T
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
INADA, T
KREKELER, S
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
KREKELER, S
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
MAYER, JW
EISEN, FH
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
EISEN, FH
WELCH, BM
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
WELCH, BM
[J].
SOLID-STATE ELECTRONICS,
1977,
20
(03)
: 213
-
217
[8]
OUTDIFFUSION THROUGH SILICON OXIDE AND SILICON NITRIDE LAYERS ON GALLIUM ARSENIDE
GYULAI, J
论文数:
0
引用数:
0
h-index:
0
GYULAI, J
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
MAYER, JW
MITCHELL, IV
论文数:
0
引用数:
0
h-index:
0
MITCHELL, IV
RODRIGUEZ, V
论文数:
0
引用数:
0
h-index:
0
RODRIGUEZ, V
[J].
APPLIED PHYSICS LETTERS,
1970,
17
(08)
: 332
-
+
[9]
HEMMENT PLF, 1975, ION IMPLANTATION SEM, P27
[10]
QUANTITATIVE DETECTION OF OXYGEN IN SILICON-NITRIDE ON SILICON
HOLLOWAY, PH
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
HOLLOWAY, PH
STEIN, HJ
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
STEIN, HJ
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1976,
123
(05)
: 723
-
728
←
1
2
→