Scanning gate microscopy of current-annealed single layer graphene

被引:40
作者
Connolly, M. R. [1 ]
Chiou, K. L. [1 ]
Smith, C. G. [1 ]
Anderson, D. [1 ]
Jones, G. A. C. [1 ]
Lombardo, A. [2 ,3 ]
Fasoli, A. [3 ]
Ferrari, A. C. [3 ]
机构
[1] Univ Cambridge, Cavendish Lab, Dept Phys, Cambridge CB3 0HE, England
[2] Univ Palermo, Dipartimento Ingn Elettr Elettron & Telecomunicaz, I-90128 Palermo, Italy
[3] Univ Cambridge, Dept Engn, Cambridge CB3 OFA, England
基金
英国工程与自然科学研究理事会;
关键词
annealing; current density; electrical conductivity; electron-hole recombination; graphene; scanning probe microscopy; CHARGE INHOMOGENEITY; TRANSPORT;
D O I
10.1063/1.3327829
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have used scanning gate microscopy to explore the local conductivity of a current-annealed graphene flake. A map of the local neutrality point (NP) after annealing at low current density exhibits micron-sized inhomogeneities. Broadening of the local e-h transition is also correlated with the inhomogeneity of the NP. Annealing at higher current density reduces the NP inhomogeneity, but we still observe some asymmetry in the e-h conduction. We attribute this to a hole-doped domain close to one of the metal contacts combined with underlying striations in the local NP.
引用
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页数:3
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