HIGH-FIELD CURRENT INDUCED-POSITIVE CHARGE TRANSIENTS IN SIO2

被引：68

作者：

NISSANCOHEN, Y

SHAPPIR, J

FROHMANBENTCHKOWSKY, D

机构：

来源：

关键词：

D O I：

10.1063/1.331805

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：5793 / 5800

页数：8

共 36 条

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[8] DIELECTRIC INSTABILITY AND BREAKDOWN IN SIO2 THIN-FILMS
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