TETRAHEDRALLY SYMMETRICAL DX-LIKE STATES OF SUBSTITUTIONAL DONORS IN GAAS AND ALXGA1-XAS ALLOYS

被引:50
作者
CHADI, DJ
机构
[1] NEC Research Institute, Princeton, NJ 08540-6620
来源
PHYSICAL REVIEW B | 1992年 / 46卷 / 11期
关键词
D O I
10.1103/PhysRevB.46.6777
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The structural and electronic properties of Si, Ge, Sn, S, Se, and Te substitutional donors in GaAs are examined via self-consistent pseudopotential calculations. Two distinct negatively charged DX-like deep donor states are found. The first has a broken-bond atomic configuration while the second arises from a symmetric "breathing-mode" relaxation around the impurity. The energies of the two configurations are especially close for Sn, Se, and Te donors. Experimental data on DX centers in A1xGa1-xAs alloys are analyzed within this model.
引用
收藏
页码:6777 / 6780
页数:4
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共 46 条
  • [11] PRESSURE-INDUCED SHALLOW-TO-DEEP DONOR-STATE TRANSITION IN SN-119-DOPED GAAS OBSERVED BY MOSSBAUER-SPECTROSCOPY
    GIBART, P
    WILLIAMSON, DL
    MOSER, J
    BASMAJI, P
    [J]. PHYSICAL REVIEW LETTERS, 1990, 65 (09) : 1144 - 1147
  • [12] DX CENTERS IN SN-DOPED GA0.7AL0.3AS
    HAYES, TM
    WILLIAMSON, DL
    OUTZOURHIT, A
    SMALL, P
    GIBART, P
    RUDRA, A
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 1989, 18 (02) : 207 - 208
  • [13] THEORY OF SUBSTITUTIONAL DEEP TRAPS IN COVALENT SEMICONDUCTORS
    HJALMARSON, HP
    VOGL, P
    WOLFORD, DJ
    DOW, JD
    [J]. PHYSICAL REVIEW LETTERS, 1980, 44 (12) : 810 - 813
  • [14] JANTSCH W, 1991, 16TH P INT DEF C, P799
  • [15] DISCOVERY OF A NEW PHOTOINDUCED ELECTRON TRAP STATE SHALLOWER THAN THE DX CENTER IN SI DOPED ALXGA1-XAS
    JIA, YB
    LI, MF
    ZHOU, J
    GAO, JL
    KONG, MY
    YU, PY
    CHAN, KT
    [J]. JOURNAL OF APPLIED PHYSICS, 1989, 66 (11) : 5632 - 5634
  • [16] STRUCTURE AND DYNAMICS OF THE DX CENTER IN GAAS-SI
    JONES, R
    OBERG, S
    [J]. PHYSICAL REVIEW B, 1991, 44 (07): : 3407 - 3408
  • [17] TRAPPING CHARACTERISTICS AND A DONOR-COMPLEX (DX) MODEL FOR THE PERSISTENT PHOTOCONDUCTIVITY TRAPPING CENTER IN TE-DOPED ALXGA1-XAS
    LANG, DV
    LOGAN, RA
    JAROS, M
    [J]. PHYSICAL REVIEW B, 1979, 19 (02) : 1015 - 1030
  • [18] LARGE-LATTICE-RELAXATION MODEL FOR PERSISTENT PHOTOCONDUCTIVITY IN COMPOUND SEMICONDUCTORS
    LANG, DV
    LOGAN, RA
    [J]. PHYSICAL REVIEW LETTERS, 1977, 39 (10) : 635 - 639
  • [19] INVESTIGATION OF THE DX CENTER IN HEAVILY DOPED N-TYPE GAAS
    MAUDE, DK
    PORTAL, JC
    DMOWSKI, L
    FOSTER, T
    EAVES, L
    NATHAN, M
    HEIBLUM, M
    HARRIS, JJ
    BEALL, RB
    [J]. PHYSICAL REVIEW LETTERS, 1987, 59 (07) : 815 - 818
  • [20] CHARACTERIZATION OF THE DX CENTER IN THE INDIRECT ALXGA1-XAS ALLOY
    MIZUTA, M
    MORI, K
    [J]. PHYSICAL REVIEW B, 1988, 37 (02): : 1043 - 1046