ESTIMATION OF PROTON UPSET RATES FROM HEAVY-ION TEST DATA

被引:33
作者
ROLLINS, JG
机构
[1] Technology Modeling Associates, Palo Alto, CA
关键词
D O I
10.1109/23.101215
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The majority of single event upset (SEU) test data is taken with heavy ions and very few parts have been tested with protons. In low earth orbit, however, due to the large trapped proton flux, if a device is sensitive to proton upset the proton upset rate may be much larger than the heavy ion upset rate. This paper attempts to bridge this gap and gives a simple method of calculating the proton upset rates from heavy ion test data. © 1990 IEEE
引用
收藏
页码:1961 / 1965
页数:5
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